نتایج جستجو برای: afm و xrd
تعداد نتایج: 790328 فیلتر نتایج به سال:
Multilayer superlattice coatings of TiN/CrN were deposited on silicon substrates using a reactive d.c. magnetron sputtering process. Superlattice period, also known as modulation wavelength (A), was controlled by controlling the dwell time of the substrate underneath Ti and Cr targets. X-ray diffraction (XRD), nanoindentation and atomic force microscopy (AFM) were used to characterize the fdms....
In this study, the structural and nanomechanical properties of Cu₂O thin films are investigated by X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM) and nanoindentation techniques. The Cu₂O thin films are deposited on the glass substrates with the various growth temperatures of 150, 250 and 350 °C by using radio frequency magnetron sputtering. The XRD re...
Undoped and Mg-doped ZnO thin films were deposited on Si (111) and quartz substrates by using the sol–gel method. Microstructure, surface topography and water contact angle of the thin films have been measured by X-ray diffraction (XRD), an atomic force microscope (AFM) and water contact angle apparatus, respectively. The XRD results show that all the thin films are polycrystalline with a hexag...
Sn-doped Zinc oxide is experimented in this research work using sol-gel method. The sol is here constructed using the zinc-acetate dehydrate and tin chloride. Once the solution is prepared, the analysis is performed for XRD patterns at different temperature values. The intensity analysis is been performed for different annealing temperatures at different wavelength. The results show that as the...
The effect of base temperature variation on the heat transfer from unsteady state annular heat sink of cooling microelectronic device. Three types of the base temperature variation equations are taken in the present study. The Sine wave variation, Cosine wave variation & exponential variation of the base temperature. The finite element technique based on Galerkin method with axisymmetric rectan...
هدف اصلی این تحقیق، بررسی خواص ساختاری و مغناطیسی لایه نازک fept نسبت به دمای بازپخت است. لایه های نازک fept به روش کندوپاش روی زیرلایه شیشه ای با نرخ 6 و با توان w 110 رسوب داده شدند. خلأ اولیه محفظه کندوپاش برابر torr 7-10 5 و فشار گاز آرگون mtorr 3 در نظر گرفته شد. پس از تهیه نمونه ها، در محدوده 650-450 به مدت 30 دقیقه بازپخت شدند. شناسایی فازی لایه نازک با استفاده ا...
Abstract In this research, aluminum (Al) thin films were deposited on SiO 2 /Si substrates using RF magnetron sputtering technique for analyzing the influence of power microstructural surface morphologies. Different powers (100–400 W) employed to form Al films. The characteristics are investigated X-ray diffraction pattern (XRD), scanning electron microscopy (SEM), atomic force (AFM) and Fourie...
This paper reports findings from an AHRC-funded project into the use of more than one language in research projects. Using 35 seminar presentations and 25 researcher profiles, we investigated how researchers from differing disciplines became aware of the possibilities, complexities, and emerging practices of researching where more than one language is used: for example, in initial research desi...
Variations of heavy metals concentrations (Pb, Zn, Ni and Cd) in suspended matter as well as the physical properties (temperature, salinity, dissolved oxygen and pH) at five coastal sites and one reference station (offshore) were measured on seasonal base of the year 2005. Seasonal variations of seawater temperature, salinity, pH and dissolved oxygen were significant different, meanwhile; spati...
ت ُـ ا ةيباسحلا جماربلا لامعتسا نع ةجتانلا ةيلعافلا سايقل ةيّقيبطت تانوّكم ةساردلا هذه ددّح ةعوفدمل ةيتامولعم ةيمآ دوجوب يبيرقتلا قطنملا ةيرظن ىلع ةزكترملا هيجوتلاو ةرطيسلا ةمظنأ ةسدنه ىلإ ةفداه . نإ اعم دوجوب اهلامعتسا لجلأ ةهجوم ةيّسايقلا تانوّكملا ةيطّخ ريغو ةدقعم ةيباسح تلاد . و ثحبت ةساردلا هذه نم ةيّسايقلا تانوّكملا لامعتسا يف اهدامتعا بجاولا ةقيرطلا يف اًضيأ أ نم فلتخم ددع نيب ليضفتلا لج تامولعملا...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید