Nanometer CMOS VLSI circuits are highly sensitive to soft errors, also known as single-event upsets (SEU) that induce current pulses at random times and at random locations in a digital circuit. Environmental causes of SEU include cosmic radiation and high-energy particles. Our neutron induced soft error rate (SER) estimation method propagates single event transient (SET) pulses through the aff...

A series of experiments were carried out at the Radiation Effects Facility (RADEF) [1] in the Accelerator laboratory of the University of Jyväskylä. Experiments consisted in irradiating the memory arrays in vacuum with a variety of heavy ions. The effect of Linear Energy Transfer (LET) of incoming ion and component operating mode (static/active) [2] on the component failure mode (SEU/MBU/SEFI) ...

Radiation induced failure modes of the Virtex I family have already been analyzed in the past. About configuration logic in particular, at least three kinds of Single Event Functional Interrupts (SEFIs) were believed to exist in the Virtex I, as a consequence of Single Event Upsets [1]: 1) JTAG TAP controller upset; 2) configuration control state machines reset (FSM POR SEFI); 3) SelectMAP conf...

In this paper, we present a new technique to improve the reliability of SRAMs used in space radiation environments. This technique deals with the SRAM power-bus monitoring by using Built-In Current Sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the...

Control Flow Errors have been widely addressed in literature as a possible threat to the dependability of computer systems, and many clever techniques have been proposed to detect and tolerate them. Nevertheless, it has never been discussed i f the overheads introduced by many of these techniques ore justified by a reasonable probabilip of incurring Control Flow Errors. This paper presents a st...

Recently, there has been a growing concern that, in relation to process technology scaling, the soft-error rate will become a major challenge in designing reliable systems. In this work, we introduce a high-fidelity, high-performance simulation infrastructure for quantifying the derating effects on soft-error rates while considering microarchitectural, timing and logic-related masking, using re...

The Reconfiguration for Reliability: Application of partial reconfiguration, exploiting the benefits of on-line fault detection to identify the occurrence of a SEU; such information is used to localize the portion of the FPGA to be re-configured to recover from the error by dynamically performing partial reconfiguration. All information on fault localization and the part to be re-configured are...

MARS. J. J Plaut 1 , A. Safaeinili 1 , B. A. Campbell 2 , R. J. Phillips 3 , N. E. Putzig 3 , D. C. Nunes 1 , R. Seu 4 . 1 Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109 ([email protected]), 2 Center for Earth and Planetary Studies, National Air and Space Museum, Smithsonian Institution, Washington, D.C. 20560, 3 Southwest Research Institute, Boulder, CO 8030...

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