Atomic force microscopy (AFM) operates on a very different principle than other forms of microscopy, such as optical microscopy or electron microscopy. The key component of an AFM is a cantilever that bends in response to forces that it experiences as it touches another surface. Forces as small as a few picoNewtons can be detected and probed with AFM. AFM has become very useful in biological sc...

Atomic force microscopy (AFM) is a key tool of nanotechnology with great importance in applications to DNA nanotechnology and to the recently emerging field of RNA nanotechnology. Advances in the methodology of AFM now enable reliable and reproducible imaging of DNA of various structures, topologies, and DNA and RNA nanostructures. These advances are reviewed here with emphasis on methods utili...

Treatment with acifluorfen-methyl (AFM), methyl 5-(2-chloro-4-[tri-fluoromethyl] phenoxy)-2-nitrobenzoate, inhibited protochlorophyllide synthesis in dark-held, delta-amino levulinic acid-fed, excised cotyledons of cucumber (Cucumis sativus L.). Protochlorophyllide and protoporphyrin IX levels in AFM-treated cotyledons were inversely related and dependent on AFM concentration; as the herbicide ...

The spatial extent zeta(AFM) and strength J(AFM) of the antiferromagnetic (AFM) exchange coupling at buried Gd /Fe interfaces in ferrimagnetic [Gd(50 A)Fe(15,35 A)](15) sputtered multilayers is obtained from combined x-ray resonance magnetic reflectivity and magnetic circular dichroism measurements. zeta(AFM) is 4.1(7) A or approximately 1-2 interatomic distances in bulk Gd and Fe; J(AFM) is 10...

ةيوافمللا ةدغلا هلازإ لاجم يف انتربخ نايب ضرعتسن :فادهلأا .ركبلما يدثلا ناطرس تاضيرم ىدل ةسرالحا دلاخ كللما ىفشتسم يف ةيعجرلما ةساردلا هذه تيرجأُ :ةقيرطلا رياني ينب ام ةرتفلا للاخ ةيدوعسلا ةيبرعلا ةكلملما ،ضايرلا ،يعمالجا ناطرسب ةضيرم 120 ةساردلا تلمش .م2014 ربمسيد و م2005 عم ةسرالحا ةيوافمللا ةدغلا ةلازإ ةيلمعل نعضخ يتلالا و يدثلا ةصالخا تامولعلما عمج تم .ةدغلا هذهل ينلاا يحيرشتلا صحفلا و ةسرال...

All atomic force microscope (AFM) images suffer from distortions, which are principally produced by the interaction between the measured sample and the AFM tip. The atomic force microscope (AFM) is a very important instrument for use in nanotechnology and biology since it can be used to measure a wide variety of objects, such as nano-particles and cells, either in air or liquid. However, the im...