نتایج جستجو برای: thermal annealing

تعداد نتایج: 240133  

2006
L. Fu H. H. Tan I. McKerracher J. Wong-Leung C. Jagadish

In this work, rapid thermal annealing was performed on InGaAs/GaAs quantum dot infrared photodetectors QDIPs at different temperatures. The photoluminescence showed a blueshifted spectrum in comparison with the as-grown sample when the annealing temperature was higher than 700 °C, as a result of thermal interdiffusion of the quantum dots QDs . Correspondingly, the spectral response from the ann...

Journal: :Nanoscale 2013
Jiachen Xue Gurpreet Singh Zhe Qiang Alamgir Karim Bryan D Vogt

Surfactant or block copolymer-templated mesoporous films have been extensively explored, but achieving mesostructure coherence and unidirectional orientation over macroscopic dimensions has remained quite challenging for these self-assembled systems. Here, we extend the concepts associated with zone refinement of crystalline materials to soft templated mesoporous carbon films based on the coope...

2017
Chaochao Fu Yan Wang Peng Xu Lei Yue Feng Sun David Wei Zhang Shi-Li Zhang Jun Luo Chao Zhao Dongping Wu

Articles you may be interested in Influence of thickness on crystallinity in wafer-scale GaTe nanolayers grown by molecular beam epitaxy Pressure induced self-doping and dependence of critical temperature in stoichiometry YBa2Cu3O6.95 predicted by first-principle and BVS calculations Kinetics of the permanent deactivation of the boron-oxygen complex in crystalline silicon as a function of illum...

صالحی, سیدمحمدعلی, میرجلیلی, غضنفر, جلیل پیران, علی,

CdS thin films were deposited by thermal evaporation in a vacuum of ~ 10-5 torr at room temperature. Samples were subjected to annealing in the range of temperatures 100-300 oC for 1 hour in air.The crystal structure of CdS films was characterized by XRD technique. Only hexagonal phase with the preferred (002) plane was found in CdS films

2002
A. J. Chiquito

The characteristics of multi-layered InAs/GaAs self assembled quantum dots (SAQDs) annealed after the growth were here studied using a combination of capacitance-voltage (C-V) measurements, Raman scattering and photoluminescence (PL) spectroscopy. The combination of the results obtained with the three techniques, gave evidences that the annealing at 500oC causes the sharpness of the SAQDs inter...

Journal: :Physical chemistry chemical physics : PCCP 2012
Oleksandr V Mikhnenko Jason Lin Ying Shu John E Anthony Paul W M Blom Thuc-Quyen Nguyen Maria Antonietta Loi

We show that the method we have developed for measuring the singlet exciton diffusion length in blends with [6,6]-phenyl-C(61)-butyric acid methyl ester (PCBM) can be applied not only to polymeric materials, but also to small molecule organic semiconductors. Small organic molecules have a large potential for molecular re-organization upon thermal annealing. Here we show that the exciton diffusi...

2016
M. Loghmarti K. Mahfoud L. Ventura J. Muller D. Sayah P. Siffert

Large grain polycrystalline silicon wafers have been subjected to post~annealing (900 °C/45 ruin) after POCI3 pre-diffusion at different temperatures. For the first time we have investigated the effect of the furnace starting and quenching temperature on the gettering efficiency. The optimisation of thermal cycle parameters include the determination of the best combination of starting temperatu...

2016
Kumhyo Byon Douglas Tham John E. Fischer Alan T. Johnson K. Byon J. E. Fischer A. T. Johnson

High performance ambipolar silicon nanowire (SiNW) transistors were fabricated. SiNWs with uniform oxide sheath thicknesses of 6–7 nm were synthesized via a gas-flow-controlled thermal evaporation method. Field effect transistors (FETs) were fabricated using as-grown SiNWs. A two step annealing process was used to control contacts between SiNW and metal source and drain in order to enhance devi...

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