نتایج جستجو برای: scanning probe microscope

تعداد نتایج: 272834  

Journal: :Langmuir : the ACS journal of surfaces and colloids 2008
Ofer Manor Ivan U Vakarelski Geoffrey W Stevens Franz Grieser Raymond R Dagastine Derek Y C Chan

A bubble attached to the end of an atomic force microscope cantilever and driven toward or away from a flat mica surface across an aqueous film is used to characterize the dynamic force that arises from hydrodynamic drainage and electrical double layer interactions across the nanometer thick intervening aqueous film. The hydrodynamic response of the air/water interface can range from a classica...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه صنعتی خواجه نصیرالدین طوسی - دانشکده برق 1390

یکی از مهمترین فاکتورهای تولید قیمت تمام شده میباشد, به این منظور از نانو فیلر پرداخت نشده استفاده شده و همینطور برای مخلوط کردن نانو به صورت یکنواخت در نمونه از دستگاه مخلوط کن با سرعت بالا همراه با دستگاه ultrasonic استفاده شده است. از آنجایی که چگونگی مخلوط شدن نانو داخل اپوکسی دارای اهمیت بالایی میباشد, برای مشاهده چگونگی مخلوط شدگی نانو داخل اپوکسی از عکسهای میکروسکوپی sem ( scanning elec...

Journal: :Micron 2012
Byung I Kim Ryan D Boehm

We designed and developed a high-speed atomic force microscope (HSAFM) utilizing a force-feedback scheme for imaging large biological samples. The system collects three simultaneous images: a deflection image, a topographic image, and a force image. We demonstrated that this force-feedback HSAFM is capable of acquiring large topographic images of Escherichia coli biofilms at approximately one f...

Journal: :Physical review letters 2003
E Riedo E Gnecco R Bennewitz E Meyer H Brune

The friction force on a nanometer-sized tip sliding on a surface is related to the thermally activated hopping of the contact atoms on an effective atomic interaction potential. A general analytical expression relates the height of this potential and the hopping attempt frequency to measurements of the velocity dependence of the friction force performed with an atomic force microscope. While th...

Journal: :Nanotechnology 2010
Soma Das A K Raychaudhuri P A Sreeram Dirk Dietzel

We show that the static force spectroscopy curve taken in an atomic force microscope is significantly modified due to presence of intrinsic cantilever instability which occurs as a result of its movement in a nonlinear force field. This instability acts in tandem with such instabilities as water bridge or molecular bond rupture and makes the static force spectroscopy curve (including 'jump-off-...

Journal: :Molecules 2016
Sarah Loebner Joachim Jelken Nataraja Sekhar Yadavalli Elena Sava Nicolae Hurduc Svetlana Santer

We demonstrate in situ recorded motion of nano-objects adsorbed on a photosensitive polymer film. The motion is induced by a mass transport of the underlying photoresponsive polymer material occurring during irradiation with interference pattern. The polymer film contains azobenzene molecules that undergo reversible photoisomerization reaction from trans- to cis-conformation. Through a multi-sc...

Journal: :Journal of the Royal Society, Interface 2012
Jason Reed Carlin Hsueh Miu-Ling Lam Rachel Kjolby Andrew Sundstrom Bud Mishra J K Gimzewski

We discuss a novel atomic force microscope-based method for identifying individual short DNA molecules (<5000 bp) within a complex mixture by measuring the intra-molecular spacing of a few sequence-specific topographical labels in each molecule. Using this method, we accurately determined the relative abundance of individual DNA species in a 15-species mixture, with fewer than 100 copies per sp...

Journal: :Ultramicroscopy 2008
M H Mahdavi A Farshidianfar M Tahani S Mahdavi H Dalir

This paper focuses on the development of a complete model of an atomic force microscope (AFM) micro-cantilever beam, based on considering the effects of four major factors in modeling the cantilever. They are: rotary inertia and shear deformation of the beam and mass and rotary inertia of the tip. A method based on distributed-parameter modeling approach is proposed to solve the governing equat...

2017
A. Agronin M. Molotskii Y. Rosenwaks G. Rosenman A. Gruverman

Journal: :Science 2010
Zhongqing Wei Debin Wang Suenne Kim Soo-Young Kim Yike Hu Michael K Yakes Arnaldo R Laracuente Zhenting Dai Seth R Marder Claire Berger William P King Walter A de Heer Paul E Sheehan Elisa Riedo

The reduced form of graphene oxide (GO) is an attractive alternative to graphene for producing large-scale flexible conductors and for creating devices that require an electronic gap. We report on a means to tune the topographical and electrical properties of reduced GO (rGO) with nanoscopic resolution by local thermal reduction of GO with a heated atomic force microscope tip. The rGO regions a...

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