Scattering-type scanning near-field optical microscopy (s-SNOM) is applied to investigate three-dimensional optical near field distribution, including both amplitude and phase information. A method analogous to the force volume mode of the atomic force microscopy (AFM) technique is adapted for the measurement. The results show high lateral resolution of tens of nanometers, and even higher verti...

The most difficult task in near-field scanning optical microscopy (NSOM) is to make a high quality subwavelength aperture probe. Recently, we have developed high definition NSOM probes by focused ion beam (FIB) milling. These probes have a higher brightness, better polarization characteristics, better aperture definition and a flatter end face than conventional NSOM probes. We have determined t...

A technique that combines scanning electrochemical microscopy (SECM) and optical microscopy (OM) was implemented with a new probe tip. The tip for scanning electrochemicaVoptical microscopy (SECM/OM) was constructed by insulating a typical gold-coated near-field scanning optical microscopy tip using electrophoretic anodic paint. Once fabricated, the tip was characterized by steady-state cyclic ...

A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this socalled strong tip model for the solution of the associated inverse scattering problem are studied through simulations.