نتایج جستجو برای: ray optics
تعداد نتایج: 332908 فیلتر نتایج به سال:
Three-dimensional phase-contrast X-ray microtomography with scanning–imaging X-ray microscope optics
A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning-imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dime...
The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilise their capability for imaging and probing biological cells, nanodevices, and functional matter on the nanometer scale with chemical sensitivity. Here we demonstrate focusing a hard X-ray beam to an 8 nm focus using a volume zone plate (also referred to as a wedged multilayer Laue lens). This ...
Current methods for predicting stress distribution on a cell surface due to optical trapping forces are based on a traditional ray optics scheme for fixed geometries. Cells are typically modeled as solid spheres as this facilitates optical force calculation. Under such applied forces however, real and non-rigid cells can deform, so assumptions inherent in traditional ray optics methods begin to...
Fresnel zone plates are the key optical elements for nanoscale focusing of X‐ray beams with high spatial resolution. Conventional zone plates manufactured by planar nanotechnology processes are limited by the achievable aspect ratios of their zone structures. Additionally, ultra‐high resolution X‐ray optics with high efficiency require 3‐D shaped tilted z...
Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must ...
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