نتایج جستجو برای: process monitoring

تعداد نتایج: 1575038  

2012
Liping Li

The global power sector is facing a number of issues, but the most fundamental challenge is meeting the rapidly growing demand for energy services in a sustainable way. This challenge is further compounded by the today’s volatile market rising fuel costs, increased environmental regulations, etc. Plant owners are challenged to prepare for the impact of future fuel price increases and carbon tax...

2009
SORIN DAN GRIGORESCU OCTAVIAN MIHAI GHITA

– World wide drilling is developing for oil, gas or water resources. Electric motors power 75% of the total drilling rigs installation, augmenting to 95% for the case of Romania. Monitoring diesel generators micro-power station and motors of the rig is the second important thing to do and complete the main task of drilling process monitoring. This paper describe a monitoring and control system ...

1999
David A. Dornfeld

New demands are being placed on monitoring systems in precision manufacturing because of recent developments and trends in machining technology and machine tool design. This paper first discusses the requirements for sensor technology for precision manufacturing process monitoring in general. Then, background and details are given about acoustic emission (AE) and the application of AE sensing t...

2001
Christian Bauckhage Jannik Fritsch Gerhard Sagerer

Machine learning is a desirable property of computer vision systems. Especially in process monitoring knowledge of temporal context speeds up recognition. Moreover, memorizing earlier results allows to establish qualitative relations between the stages of a processes. In this contribution we present an architecture that learns diierent visual aspects of assemblies. It is organized hierarchicall...

2005
Lei Xie Shu-qing Wang Jian-ming Zhang

Chemical process variables are always driven by random noise and disturbances. The closed-loop control yields process measurements that are auto & cross correlated. The influence of auto & cross correlations on statistical process control (SPC) is investigated in detail. It is revealed both auto and cross correlations among the variables will cause unexpected false alarms. Dynamic PCA and ARMA-...

2002
LIANJIE SHU DANIEL W. APLEY FUGEE TSUNG

Some of the most widely-investigated control charting techniques for autocorrelated data are based on time series residuals. If the mean shift in the autocorrelated process is a sudden step shift, the resulting mean shift in the residuals is time varying and has been referred to as the fault signature. Traditional residual based charts, such as a Shewhart, CUSUM, or EWMA on the residuals, do no...

1999
R. Sekar Thomas F. Bowen Mark E. Segal

Class Different levels of abstraction may be desired in different contexts, and hence there may be overlaps among different user-defined abstract events. For instance, we may have an abstract event that corresponds to readOpen, and another that corresponds to any open, regardless of whether it is for reading or writing. For simplicity, we restrict the definition of abstract events to be primiti...

2014
Michael Carl Thomas Jose Romagnoli Greg Robertson TENNESSEE EASTMAN

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2004
J.-W. Liaw C.-C. Hsiao Clinton Fong Y.-L. Tsai S.-C. Chung Oleg Demin

Plasma electrolytic oxidation (PEO) is a potential technique to coat a dense ceramic oxide layer on the surface of light metals, e.g. Al, Mg or Ti. In our PEO process, Al-pieces are emerged in aqueous solutions containing dissolved silicate/alkali, e.g. KOH/NaOH and K 2 SiO 3 /Na 2 SiO 3. Using a DC-pulsed system with 20Hz, micro-arcs are induced at the surface of the pieces randomly and plasma...

Journal: :IBM Journal of Research and Development 1976
Charles H. Stapper

This paper describes an analytical technique for quantifying and modeling the frequency of occurrence of integrated circuit failures. The method is based on the analysis of random and clustered defects on wafers with defect monitors. Results from pilot line data of photolithographic defects, insulator short circuits, and leaky pn junctions are presented to support the practicality of the approa...

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