Magnetic near-field probes (NFP) represent a suitable tool to measure the magnetic field level from small electromagnetic interference (EMI) source. This kind of antenna is useful as probe for pre-compliance EMC measurements or debugging tasks since user can scan printed circuit board (PCB) looking locations with strong fields. When H-field point found, designer should check PCB layout and comp...

The influence of the near-field probe-tip on a model sample consisting one-dimensional apertures is investigated using scanning optical microscopy (SNOM). We use finite-difference time-domain (FDTD) simulations combined with SNOM scans to show that has rather profound effect shape measured transmission intensity profiles. By taking into account perturbations introduced by probe, our newly devel...

We analyse the changes in the partial polarization of random, stationary light fields in transmission through a near-field probe. The probe is modelled as a two-dimensional metal-coated optical fibre tip through which the field is propagated by applying the boundary-integral method. Both the magnitude of the opening angle and the aperture size of the probe are found to significantly influence t...

Near-field scanning optical microscopy enables the simultaneous topographical and subdiffraction limited optical imaging of surfaces. A process is presented for the implementation of single individually engineered gold cones at the tips of atomic force microscopy cantilevers. These cantilevers act as novel high-performance optical near-field probes. In the fabrication, thin-film metallization, ...

For linear light scattering in apertureless scanning near-field optical microscopy, we have studied the correlations between the tip radius of the probe, signal strength, spatial resolution, and sample material. Pronounced variations of the near-field distance dependence on tip shape and dielectric function of the sample are observed. For very sharp metal tips, the scattered near-field signal d...