Motion control manufacturers today are under immense pressure due to global competition and regulatory constraints. Many, however, cannot retain the skilled people in house required to develop a complex motor drive product. This fact has actually created a thriving market for motion control consultants, but even though these consultants are usually skilled in the art, manufacturers cannot risk ...

-The performance of IC interconnects has been stretched tremendously recently years by high speed integrated circuit systems. Even though S-parameters are popularly used for the characterization of IC interconnects, their modeling has to consider the existence of active devices, such as buffers and drivers. The I/O model is difficult to obtain due to the IP protection and limited information. I...

Recent advances in technology are leading to increases in the complexity and applications of analogue and mixedsignal integrated circuits. This trend has been accomponied by an increase in the complexity of associated test specifications. Furthermore, the use of functional & specification based test programs for the analogue circuitry is being questioned due to high implementation costs, the di...

Abstract Analog ICs in general have many performance metrics that depends on multitude of device parameters. Parametric yield loss is often a problem in analog IC designs, where a significant portion of ICs manufactured fail specification test due to variation in process parameters. Parametric faults are mainly caused by statistical fluctuations in the manufacturing process. It causes the analo...

Glass-substrate Multi-electrode Arrays (MEAs) have become a valuable tool in neurophysiological research and drug screening. A typical setup for MEA recording is based on discrete-element preamplifiers located close to the MEA device and a multi-wire cable that conducts the pre-amplified analog signals to a data acquisition card. With the increase in the number of MEA sensing sites, this approa...

The Digital Integrated Circuit Tester implemented as in this paper is capable of testing 14 pin Integrated Circuits (ICs) of 7400 series. First, the system welcomes the user and asks the user to enter IC number. It takes the last two digits of the IC no. of the IC to be tested as input from a 4x3 matrix keyboard which is implemented by 12 push buttons. It then checks the IC(in the 14 pin socket...