نتایج جستجو برای: ghoran gate

تعداد نتایج: 42908  

2004
D.A.J. Moran E. Boyd F. McEwan H. McLelland C. R. Stanley I. G. Thayne

This work describes the improved uniformity of short gate length (sub100nm) T-gate lithography observed for InP HEMT devices through the development of a nonannealed ohmic contact process. The incorporation of such a process allows the reversal of ohmic and gate levels as part of a standard device process flow. This eliminates fluctuations in the gate geometry that result from the spinning of g...

2011
B. Rajesh Kumar T. Subba Rao

High-k gate dielectrics are used to suppress excessive transistor gate leakage and power consumption could speed up the introduction of metal gates in complementary metal oxide semiconductor (CMOS) transistors. Many new oxides are being evaluated as gate dielectrics, such as Al2O3, Y2O3, La2O3, Gd2O3, HfO2, ZrO2, and TiO2, BaZrO3, ZrSiO4 and HfSiO4. Ru, RuO2 and SrRuO3 gate electrodes grown on ...

This paper is the first study on the impact of ambient temperature on the electrical characteristics and high frequency performances of double gate armchair graphene nanoribbon field effect transistor (GNRFET). The results illustrate that the GNRFET under high temperature (HT-GNRFET) has the highest cut-off frequency, lowest sub-threshold swing, lowest intrinsic delay and power delay product co...

پایان نامه :وزارت علوم، تحقیقات و فناوری - دانشگاه شیراز - دانشکده علوم پایه 1392

a novel and ultra low cost isfet electrode and measurement system was designed for isfet application and detection of hydronium, hydrazinium and potassium ions. also, a measuring setup containing appropriate circuits, suitable analyzer (advantech board), de noise reduction elements, cooling system and pc was used for controlling the isfet electrode and various characteristic measurements. the t...

2009
M. Radosavljevic B. Chu-Kung S. Corcoran G. Dewey M. K. Hudait J. M. Fastenau J. Kavalieros W. K. Liu D. Lubyshev M. Metz K. Millard N. Mukherjee W. Rachmady U. Shah Robert Chau

This paper describes integration of an advanced composite high-K gate stack (4nm TaSiOx-2nm InP) in the In0.7Ga0.3As quantum-well field effect transistor (QWFET) on silicon substrate. The composite high-K gate stack enables both (i) thin electrical oxide thickness (tOXE) and low gate leakage (JG) and (ii) effective carrier confinement and high effective carrier velocity (Veff) in the QW channel...

2001
E. J. Stewart M. S. Carroll James C. Sturm

Boron penetration through thin gate oxides in p-channel MOSFETs with heavily boron-doped gates causes undesirable positive threshold voltage shifts. P-channel MOSFETs with polycrystalline Si1 x yGexCy gate layers at the gate-oxide interface show substantially reduced boron penetration and increased threshold voltage stability compared to devices with all poly Si gates or with poly Si1 xGex gate...

2009
Clifton Fonstad

In the depletion approximation for n-channel MOS structures we have neglected the electrons beneath the gate electrode when the gate voltage is less than the threshold voltage, VT. We said that it is only when the gate voltage is above threshold that they are significant, and that they are then the dominant negative charge under the gate. Furthermore, we say that above threshold all of the gate...

1999
Xuejue Huang Wen-Chin Lee Charles Kuo Digh Hisamoto Leland Chang Jakub Kedzierski Erik Anderson Hideki Takeuchi Yang-Kyu Choi Kazuya Asano Vivek Subramanian Tsu-Jae King Jeffrey Bokor Chenming Hu

High performance PMOSFETs with a gate length as short as 18-nm are reported. A self-aligned double-gate MOSFET structure (FinFET) is used to suppress the short channel effect. The 45 nm gate-length PMOS FinFET has an Idsat of 410 PA/Pm (or 820 PA/Pm depending on the definition of the width of a double-gate device) at Vd = Vg = 1.2 V and Tox = 2.5 nm. The quasi-planar nature of this variant of t...

2006
HYUNG RIM CHOI NAM KYU PARK BYUNG JOO PARK DONG HO YOO HAE KYOUNG KWON JOONG JO SHIN

Many container terminals all over the world strive to be mega-hub port through improving efficiency of terminal operation with high technology. Not only operating equipments in container terminal, but also container terminal gates are introducing state-of-the-art technologies in order to develop an effective gate system. This study focuses on an automation of identification task at gate. We dev...

Journal: :international journal of nanoscience and nanotechnology(ijnn 0
a. rezaei electrical engineering department, kermanshah university of technology, kermanshah, iran

complementary metal-oxide semiconductor (cmos) technology has been the industry standard to implement very large scale integrated (vlsi) devices for the last two decades. due to the consequences of miniaturization of such devices (i.e. increasing switching speeds, increasing complexity and decreasing power consumption), it is essential to replace them with a new technology. quantum-dot cellular...

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید