نتایج جستجو برای: built form
تعداد نتایج: 790412 فیلتر نتایج به سال:
As we approach 100nm technology the interconnect issues are becoming one of the main concerns in the testing of gigahertz system-onchips. Voltage distortion (noise) and delay violations (skew) contribute to the signal integrity loss and ultimately functional error, performance degradation and reliability problems. In this paper, we first define a model for integrity faults on the high-speed int...
High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using circular BIST.
A BIST method enabling two-pattern testing at-speed without violating thermal constraints by introducing cool down periods is proposed. The application of the method is demonstrated based on a scalable BIST architecture. Applicability on IP cores is given since only a two-pattern test set is required as input.
An efficient low power built-in self-test methodology based on linear feedback shift register reseeding is proposed. This new method divides each test cube into several blocks and encodes that cube into a new test cube. In the new encoded test cube, the nontransitional blocks which no specified bits is included or only one kind of specified bit (1 or 0) is encoded into only one bit (1, 0, or X)...
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