نتایج جستجو برای: atomic force microscopy thermal properties
تعداد نتایج: 1413518 فیلتر نتایج به سال:
Frequency modulation atomic force microscopy utilizes the change in resonant frequency of a cantilever to detect variations in the interaction force between cantilever tip and sample. While a simple relation exists enabling the frequency shift to be determined for a given force law, the required complementary inverse relation does not exist for arbitrary oscillation amplitudes of the cantilever...
Let’s examine briefly the actual workflow necessary to run an AFM experiment. A typical session starts with sample preparation and AFM mode selection. The latter sometimes dictating the former. Once the sample is ready, the AFM has to be set up (i.e., the sample has to be mounted, the scan mode selected, a tip inserted, and the detection system aligned). After that, the system has to be brought...
Polyethylene terephthalate (PET) based nanocomposites containing three differently modified silica particles were prepared by melt compounding. The influence of type and amount of nanosilica on various properties of nanocomposite was studied using atomic force microscope, thermal degradation, thermal-mechanical properties, scanning electron microscope, and reflectance spectra. AFM test was use...
This paper studies the properties of thermally evaporated 1 μm of aluminium (Al) thin films on polyimide (PI) and polyethylene terephthalate (PET) substrates at room temperature with thermal evaporation in a vacuum of about 3 x 10 -5 Torr for use as window materials for solar cells. Effects of substrate types on the structural and electrical characteristics of the films were studied. Sets of ex...
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