A highly transparent conductive film was fabricated using self-assembled silver electrodes with anti-reflection (AR) film. The micro pore diameter of sliver nanoparticles (ca 50~60nm in diameter) network electrodes expanded to size of 200-300 μm by the increase of air voids with evaporated water. The transmittance of the silver network electrode increased was drastically increased by the optica...

Light-trapping structures are more demanding for optimal light absorption in thin film silicon solar cells. Accordingly, new design engineering of solar cells has been emphasized and found to be effective to achieve improved performance. This paper deals with a design of thin film silicon solar cells and explores the influence of bottom grating and combination of top and bottom (dual) grating a...

We propose an approach for enhancing the absorption of thin-film amorphous silicon solar cells using periodic arrangements of resonant dielectric nanospheres deposited as a continuous film on top of a thin planar cell. We numerically demonstrate this enhancement using 3D full field finite difference time domain simulations and 3D finite element device physics simulations of a nanosphere array a...

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To prevent serious electromagnetic interference, a single-layer and double layer wave-absorbing coating employing complex absorbents composed of carbon black with epoxy resin as matrix was prepared. The morphologies of carbon black /epoxy composites were characterized by scanning electron microscope  and atomic force microscope, respectively. The carbon black  particles exhibit obvious polyarom...

In this study, indium–tin oxide (ITO)/Nb-doping TiO2 (TNO) double-layer transparent conductive (TCO) films deposited using DC magnetron sputtering were used as a surface anti-reflection layer with an overall thickness of 100 nm for films. The simulated results showed that ITO and TNO combinations 90 nm/10 nm, 80 nm/20 70 nm/30 had higher transmittance lower reflectance than others in the visibl...

The aberrations of a multilayer-coated reflective Schwarzschild objective, which are influenced both by mirror surface profiles and by multilayer coatings, are evaluated with a phase-shifting point diffraction interferometer operating in the extreme ultraviolet. Using wave-front measurements at multiple wavelengths near 13.4 nm, we observed chromatic aberrations and wavelength-dependent transmi...