نتایج جستجو برای: afm و xrd

تعداد نتایج: 790328  

2010
M. Jeřáb K. Sakurai

During last decade, nanotechnology has gained a significant relevance in many areas of basic research and applied science. One of the great challenges in the field of nanotechnology is preparation of nanoparticles and nanostructures where new, not ordinary materials are used. In the present study, we observed self organizing structures prepared by the gas deposition method in N2 atmosphere. Gla...

2016
K. Abbas R. Ahmad I. A. Khan S. Saleem U. Ikhlaq

Nitriding of p-type Si samples by pulsed DC glow discharge is carried out for different Ar concentrations (30% to 90%) in nitrogen-argon plasma whereas the other parameters like pressure (2 mbar), treatment time (4 hr) and power (175 W) are kept constant. The phase identification, crystal structure, crystallinity, chemical composition, surface morphology and topography of the nitrided layer are...

2001
A. Kuzmin J. Purans R. Kalendarev D. Pailharey Y. Mathey

Systematic studies of nanocrystalline nickel tungstate, NiWO4, thin films were performed by several experimental techniques such as Ni Kand W L1,3-edges X-ray absorption spectroscopy, X-ray diffraction, Raman spectroscopy, atomic force microscopy and cyclic voltammetry measurements. We found that the NiWO4 thin films exhibit electrochromic properties similar to that of amorphous tungsten trioxi...

2012
Manoj Pati P. L. Nayak

Ethyl Acrylate was grafted onto chitosan by using the ceric ammonium nitrate as the initiator. The effect of initiator concentration, monomer concentration, time & temperature on % G and % E were studied. The grafted samples were characterized using FTIR, SEM, atomic force microscopy AFM and XRD methods. Xray diffraction showed changes in the crystallinity pattern of chitosan after the copolyme...

2016
Sameer Atta. Makki Hiba M. Ali

This studies pCuO / n Si heterojunction was deposited by high vacuum thermal evaporation of Copper subjected to thermal oxidation at 300 o C on silicon. Surface morphology properties of The optical properties concerning the transmission spectra were studies for prepared thin films. this structure have been studied. XRD anaylsis discover that the peak at (111) and (111) plane are take over for t...

Journal: :Journal of nanoscience and nanotechnology 2010
Xuehua Wang Chengyong Li Lianjiao Ma Hong Cao

Alumina nanostructures, nanowires, and semicolumn nanotubes with high aspect ratios were synthesized by the chemical etching of porous alumina membranes (PAMs) in phosphoric acid solution. The morphology and structure of alumina nanostructures were analyzed by scanning electron microscopy (SEM), energy dispersive spectrum (EDS), and X-ray diffraction (XRD), respectively. The results showed that...

2000
A. Cavaleiro P. Goudeau J. P. Riviere A. Declemy

Ž . Ti,Al NrMo multilayered hard coatings have been designed to fulfil future applications concerning wear-prevention on tool steels. They have been deposited by reactive dc magnetron sputtering on high-speed steel substrates with modulation periods Ž . Ž . between 6.5 and 8 nm. Experimental X-ray diffraction XRD , Rutherford backscattering spectrometry RBS and computational modelling of those ...

Journal: :Journal of nanoscience and nanotechnology 2012
Ju Ho Lee Jae-Won Lee Sooyeon Hwang Sang Yun Kim Hyung Koun Cho Jeong Yong Lee Jin-Seong Park

Al-doped ZnO (AZO) thin films with various Al concentrations were synthesized on Si(001) substrates with native oxide layers by atomic layer deposition process. The effects of the Al concentration on the microstructural characteristics of the AZO thin films grown at 250 degrees C and the correlation between their microstructural characteristics and electrical properties of the AZO thin films we...

Journal: :New Journal of Chemistry 2021

BJH analysis is shown to be a highly useful method estimate the distance between stacks within plasma-exfoliated graphitic material, and coincide with data obtained from SEM, AFM XRD analysis.

2015
Suzan M. Attar

يديوتامورلا لصافلما باهتلا ضيرم180 ةساردلا تلمش :جئاتنلا عافترا نأ جئاتنلا ترهظأ .)اًماع 40.49±12.19 رمعلا طسوتم( يف LDL لدعم و )55.1%(لورتسلوكلا لدعم عافترا راشتنا لدعم عافترا ينب ةيئاصحإ ةوق تاذ ةقلاع دوجو نع تفشك .)51.2%( ىلع ةولاعو .)p=0.002( CRP لا هبسن عافترا و لورتسيلوكلا طاشنو يلكلا لورتسلوكلا ينب ةيباجيإ ةقلاع دوجو انظحلا ،كلذ طاقن رخآ ضرم ةكرتشلما اًماع 28 مادختساب اهسايق تم امك ،ضرلما ...

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