We critically compare particle induced X-ray emission (PIXE) on the ion microprobe with scanning electron microscopy with energy dispersive X-ray spectroscopy (SEMEDS) for the characterisation of gunshot residues (GSR). Samples of gunshot residue from several different firearms were collected. Individual particles of GSR were analysed by SEM-EDS using a 30keV electron beam focussed to ~10nm and...
