Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. AFM-IR works by using the tip of an AFM probe to locally detect thermal expansion in a sample resulting from absorption of infrared radiation. AFM-IR thus can provide the ...

In this study, we present a new technique called correlative atomic force and transmission electron microscopy (correlative AFM/TEM) in which a targeted region of a sample can be observed under AFM and TEM. The ultimate goal of developing this new technique is to provide a technical platform to expand the fields of AFM application to complex biological systems such as cell extracts. Recent adva...

We present COBS — a model of a concurrent object-based computational system with handshakes as elementary actions of inter-process communication. Processes are considered to be partial views of the system. Their communication by asynchronous message passing and variable sharing is modeled by elementary processes on the same abstraction level. The same acts of computation and communication can b...

Atomic force microscopy (AFM) provides a method for detecting nanoscale structural information. First, this review explains the fundamentals of AFM, including principle, manipulation, and analysis. Applications of AFM are then reported in food science and technology research, including qualitative macromolecule and polymer imaging, complicated or quantitative structure analysis, molecular inter...

The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems appro...

physical, mechanical and structural properties of poly(lactic acid) (pla)-basedfilms containing different amounts of nanoclay and cellulose prepared bysolvent casting method were examined. physical properties including thickness,transparency and color did not change significantly with addition of nanoparticles to the polymer matrix. x-ray diffraction (xrd) patterns showed that pure pla has a se...

atomic force microscopy (afm) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. afm is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. there are several methods and many ways to modify the tip of the afm to investigate surface properties, ...

Atomic force microscopy (AFM) is a state of the art imaging system that uses a sharp probe to scan backwards and forwards over the surface of an object. The probe tip can have atomic dimensions, meaning that AFM can image the surface of an object at near atomic resolution. Two big advantages of AFM compared to other methods (for example scanning tunneling microscopy) are: the samples in AFM mea...