نتایج جستجو برای: thin layer

تعداد نتایج: 382239  

Journal: :journal of optoelectronical nano structures 0
heydar izadneshan department of physics, marvdasht branch, islamic azad university, marvdasht, iran. valery gremenok scientific-practical materials research centre of national academy of sciences of belarus, minsk. ghahraman solookinejad department of physics, marvdasht branch, islamic azad university, marvdasht, iran.

cu(in,ga)se2 thin films (cigs) on metallic substrate (titanium, molybdenum, aluminum, stainless steel) were prepared by a two-step selenization of co-evaporated metallic precursors in se-containing environment under n2 gas flow. structural properties of prepared thin film were studied. to characterize the optical quality and intrinsic defect nature low-temperature photoluminescence, were perfor...

In this research, MgF2-2%SiO2/MgF2 thin films were applied on a glass substrate. At first, MgF2 thin films with the optical thickness were deposited on the glass slide substrates. Then, MgF2-2%SiO2 thin films were deposited on the glass coated with MgF2 thin films. Finally, the nanocomposite thin films were surface treated by the PFTS solution. Characterization of the thin film was done by X-Ra...

2003
R. B. Taylor

Frey HP and Zieloff K (1992) Qualitative und quantitative Du( nschicht-Chromatographie. Weinheim: VCH. Fried B and Sherma J (eds) (1996) Practical Thin Layer Chromatography: A Multidisciplinary Approach. Boca Raton, FL: CRC Press. Jork H, Funk W, Fischer W and Wimmer H (1990) Thin Layer Chromatography, vol. 1a. Physical and Chemical Detection Methods. Weinheim: VCH. Jork H, Funk W, Fischer W an...

Journal: :SEIBUTSU BUTSURI KAGAKU 1966

Journal: :NIPPON SHOKUHIN KOGYO GAKKAISHI 1988

Journal: :Journal of Chemical Education 1964

2011
V. G. Berezkin A. V. Chausov A. V. Topchiev

V.G. Berezkin, A.V. Chausov A.V. Topchiev Institute of Petrochemical Synthesis, Russian Academy of Sciences, 29, Leninsky pr., Moscow, 119991, GSP-1, Russia e-mail: berezkin@ips.ac.ru

Journal: :Nano letters 2011
Chun Hung Lui Zhiqiang Li Zheyuan Chen Paul V Klimov Louis E Brus Tony F Heinz

Few-layer graphene (FLG) has been predicted to exist in various crystallographic stacking sequences, which can strongly influence the material's electronic properties. We demonstrate an accurate and efficient method to characterize stacking order in FLG using the distinctive features of the Raman 2D-mode. Raman imaging allows us to visualize directly the spatial distribution of Bernal (ABA) and...

Journal: :Journal of Japan Oil Chemists' Society 1963

2016
Huan-Yi Cheng Ying-Chung Chen Chi-Lun Li Pei-Jou Li Mau-Phon Houng Cheng-Fu Yang

In this study, commercial-grade NiCr (80 wt % Ni, 20 wt % Cr) and NiCrSi (55 wt % Ni, 40 wt % Cr, 5 wt % Si) were used as targets and the sputtering method was used to deposit NiCr and NiCrSi thin films on Al₂O₃ and Si substrates at room temperature under different deposition time. X-ray diffraction patterns showed that the NiCr and NiCrSi thin films were amorphous phase, and the field-effect s...

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