نتایج جستجو برای: test pattern ordering

تعداد نتایج: 1161941  

Journal: :IEEE Trans. Software Eng. 1994
Teruo Higashino Gregor von Bochmann

In this paper, we propose an automatic analysis and test case derivation method for LOTOS expressions with data values. We introduce the class of P-LOTOS expressions where the data types are restricted to the integer and boolean types and the operators of the integers are restricted to addition, subtraction and comparison. For this class, we give an algorithm for deriving a set of test cases (a...

2008
T Hirano

We simulate the dynamics of Au+Au collisions at the Relativistic Heavy Ion Collider (RHIC) with a hybrid model that treats the quark-gluon plasma macroscopically as an ideal fluid, but models the hadron resonance gas microscopically using a hadronic cascade. We find that much of the mass-ordering pattern for v2(pT ) observed at RHIC is generated during the hadronic stage due to build-up of addi...

2007
Martin Atzmüller Joachim Baumeister Frank Puppe

In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In contrast, the proposed method allows for a transparent and intuitive modeling of the relations contained in the test data. For the presented approach, we utilize a general-purpose data generator: It relies on easy to und...

2007
Hans van der Schoot

2 Purpose of the method The dfc-method is intended for the selective derivation of test cases from a formal description of the system under test (SUT). The targetted selective derivation is based on the analysis of the input-output (I/O) relations in a given specification for exposing the effects of each input interaction on those output interactions which are influenced by the input interactio...

1993
Mario H. Konijnenburg J. Th. van der Linden Ad J. van de Goor

This paper extends state-of-the-art ATPG systems by including constraints, called restrictors, on the allowable values of the bits of a test vector. Such restrictors often occur in ’realworld’ circuits where certain bit positions of a test vector have to take on a particular value (e.g. in case of a reset line) or are prohibited from taking on a particular value (e.g. in order to prevent an ill...

Journal: :Physical review. E, Statistical, nonlinear, and soft matter physics 2011
Jae Sung Park David Saintillan

The long-time dynamics and pattern formation in semidilute suspensions of colloidal spheres in a viscous electrolyte under a uniform electric field are investigated using numerical simulations. The rapid chain formation that occurs in the field direction as a result of dipolar interactions is found to be followed by a slow coarsening process by which chains coalesce into hexagonal sheets and ev...

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