نتایج جستجو برای: soi

تعداد نتایج: 4097  

2009
Tze Wee Chen Jung-Hoon Chun Yi-Chang Lu Robert W. Dutton

Thermal test structures and ring oscillators (ROs) are fabricated in 0.18-μm three-dimensional (3-D)–SOI technology. Measurements and electrothermal simulations show that thermal and parasitic effects due to 3-D packaging have a significant impact on circuit performance. A physical thermal model is parameterized to provide better prediction of circuit performance in 3-D technologies. Electrothe...

Journal: :IEICE Transactions 2010
Risako Ueno Hiroto Honda Honam Kwon Koichi Ishii Masako Ogata Hitoshi Yagi Ikuo Fujiwara Kazuhiro Suzuki Keita Sasaki Hideyuki Funaki

We have analyzed the dominant noise sources in the driving circuit of an uncooled infrared radiation focal plane array fabricated on a silicon-on-insulator (SOI) substrate by 0.35 μm CMOS technology and bulkmicromachining. We found no noise property of SOI-MOSFET inferior compared to those of NMOSs formed on SOI and bulk substrate, respectively. In addition, we reduced the total noise of the se...

2007
J. Niehusmann M. Först A. Driessen

In this paper we report the ultrafast all-optical wavelength conversion in Silicon-onInsulator (SOI) waveguides. We used a pump-probe setup with 300 femtosecond pulses to demonstrate large temporal phase-shifts, caused by the Kerr effect and free carrier generation. Large wavelength shifts of a 1683nm probe signal have been observed. The wavelength conversion, ranging from 10nm redshifts to 15n...

2017
Xiang Wang Yu Ping Huang Jun Liu Jie Wang

We investigate thermal noise mechanisms and present analytical expressions of the noise power spectral density at high frequencies (HF) in Silicon-on-insulator (SOI) MOSFETs. The developed HF noise model of RF T-gate body contact (TB) SOI MOSFET for 0.13-μm SOI CMOS technology accounts for the mechanisms of 1) channel thermal noise; 2) induced gate noise; 3) substrate resistance noise and 4) ga...

1998
Hyungcheol Shin M. Racanelli Taekeun Hwang D. K. Schroder

This paper presents a new, simple method of measuring the generation lifetime in SOI (silicon-on-insulator) MOSFETS. Lifetime is extracted from the transient characteristics of MOSFET subthreshold current. Using this technique, generation lifetime was mapped across ®nished SIMOX (separation by implantated oxygen) wafers, BESOI (bonded and etchedback SOI) wafers, and UNIBOND wafers. BESOI materi...

2003
Andrew B. Watkins

The El Niño – Southern Oscillation (ENSO) maintained its warm state through the austral spring of 2002, however the Southern Oscillation Index (SOI) remained only weakly negative, with values of –7.6, –7.4 and –6.0 for September, October and November respectively. This resulted in a seasonal mean SOI of –7.0, an increase of 1.5 since the winter season (Jones 2003). The SOI for spring (arguably)...

2001
Chang-Hoon Choi Zhiping Yu Robert W. Dutton

Gate tunneling current in fully depleted, double-gate (DG) silicon-on-insultor (SOI) MOSFETs is characterized based on quantummechanical principles. The gate tunneling current for symmetrical DG SOI with ground-plane ( =1.5 nm and =5 nm) is shown to be higher relative to single-gate (bulk) MOS structure. The tunneling is enhanced as the silicon layer becomes thinner since the thinner silicon la...

2004
N. Sadachika Y. Uetsuji D. Kitamaru H. J. Mattausch M. Miura-Mattausch L. Weiss U. Feldmann S. Baba

We have developed a fully-depleted SOI-MOSFET model HiSIM-SOI for circuit simulation by solving the potential distribution along all three important SOI-surfaces selfconsistently. Besides comparison to measured I-V data, the model is verified with 1/f noise analysis, sensitive to the carrier concentration and distribution along the channel. The carrier concentration increase, due to confinement...

Journal: :Energies 2021

The effects of two pilot injections on combustion and emissions were evaluated in a single−cylinder turbocharged diesel engine, which operated premixed charge compression ignition (PCCI) modes with multiple heavy exhaust gas recirculation under the low load by experiments simulation. It was revealed that delay start first injection (SOI−P1) or advance second (SOI−P2), respectively, pressure, he...

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