In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.

An ac imaging mode for atomic force microscopy ~AFM! has been developed that employs a thermally driven bimetallic cantilever to sense surface topography. Oscillations are induced in a composite cantilever, comprising a Si3N4 layer and Au overcoat, by local heating with a resistive wire heater placed in close proximity to the cantilever. Cantilever bending occurs upon heating due to the differe...

We proposed the method of using a multi-ball-cantilever AFM for measuring the surface profile of soft thin film. At first, we performed the computer simulation to verify the feasibility of this method. Then, we developed the multi-ball-cantilever AFM system using a multi-ball-cantilever that had 8 cantilevers in 2 mm and each cantilever had the ball stylus with 10.9 μm of diameter. The fundamen...

Using scanning laser Doppler vibrometer we have identified sources of noise in contact mode high-speed atomic force microscope images and the cantilever dynamics that cause them. By analysing reconstructed animations of the entire cantilever passing over various surfaces, we identified higher eigenmode oscillations along the cantilever as the cause of the image artefacts. We demonstrate that t...

Magnetic microactuation systems of torsion silicon cantilever is described. Devices are constructed in a batch fabrication process which combines electroplating with conventional photolithography , materials, and equipment. The magnetic transducers are applied to generation of motion in micromechanical structures such as cantilever, beam, membrane. Microelectromechanical systems (MEMS) with mag...

Cantilever array-based sensor devices widely utilise the laser-based optical deflection method for measuring static cantilever deflections mostly with home-built devices with individual geometries. In contrast to scanning probe microscopes, cantilever array devices have no additional positioning device like a piezo stage. As the cantilevers are used in more and more sensitive measurements, it i...

We simulated the quantum dynamics for magnetic resonance force microscopy (MRFM) in the oscillating cantilever-driven adiabatic reversals (OSCAR) technique. We estimated the frequency shift of the cantilever vibrations and demonstrated that this shift causes the formation of a Schrödinger cat state which has some similarities and differences from the conventional MRFM technique which uses cycli...

Title of Document: EFFECTS OF WINGWALL CONFIGURATIONS ON THE BEHAVIOR OF INTEGRAL ABUTMENT BRIDGES Andreas Paraschos, Doctor of Philosophy, 2016 Dissertation Directed By: Professor Amde M. Amde Department of Civil and Environmental Engineering This research includes parametric studies performed with the use of three-dimensional nonlinear finite element models in order to investigate the effects...

The image quality and resolution of the Atomic Force Microscope (AFM) operating in tapping mode is dependent on the quality (Q) factor of the sensing micro-cantilever. Increasing the cantilever Q factor improves image resolution and reduces the risk of sample and cantilever damage. Active piezoelectric shunt control is introduced in this work as a new technique for modifying the Q factor of a p...

We report on progress in the fabrication of cantilever arrays with tips. The process features only one lithographic step for the definition of both the tips and cantilevers. The tips have a uniform height distribution and are placed by selfalignment on the cantilever. The arrays are fabricated for an optical readout technique under development in which the cantilever arrays serve as diffraction...