International Symposium on Digital Industrial Radiology and Computed Tomography Ghent, Belgium June 22-25, 2015 SKS deconvolution method corrects scatter per projection by convoluting the measured signal with the pencil beam kernels using equation (1), simulated by varying thickness of the slabs of same material as the object in the CIVA [2] RT module developed for NDT simulations by CEA. The w...

This article deals with the application of Spatial Time-Frequency Distribution (STFD) to the direction finding problem using the Multiple Signal Classification (MUSIC)algorithm. A comparative performance analysis is performed for the method under consideration with respect to that using data covariance matrix when the received array signals are subject to calibration errors in a non-stationary ...

Scatter correction is crucial to the quality of reconstructed images in x-ray cone-beam computed tomography (CBCT). Most of existing scatter correction methods assume smooth scatter distributions. The high-frequency scatter noise remains in the projection images even after a perfect scatter correction. In this paper, using a clinical CBCT system and a measurement-based scatter correction, the a...

This report describes the analysis of results of a Lincoln Laboratory experiment which consisted of a series of bistatic scatter and radar measurements of the scattering cross section per unit volume of rain and thin turbulent layers. Results of tbe experiment are presented as average and rms values of the ~ of the bistatic scatter cross section as calculated using the radar data to the cross s...

First and second order Rayleigh and Raman scatter is a common problem when fitting Parallel Factor Analysis (PARAFAC) to fluorescence excitationemission data (EEM). The scatter does not contain any relevant chemical information and does not conform to the low-rank trilinear model. The scatter complicates the analysis instead and contributes to model inadequacy. As such, scatter can be considere...

Surface scatter effects from residual optical fabrication errors can severely degrade optical performance. The total integrated scatter (TIS) from a given mirror surface is determined by the ratio of the spatial frequency band-limited " relevant " root-mean-square surface roughness to the wavelength of light. For short-wavelength (extreme-ultraviolet/x-ray) applications, even state-of-the-art o...