We present scanning tunnelling microscopy studies and first principles calculation on the 2D crystallization of pentagonal pentamethylcorannulene on a Cu(111) surface under ultrahigh vacuum in the temperature range of 50 K to 400 K. The observed 2D crystal phases and their packing densities are compared to tiling options of hard pentagons. Temperature change-induced reversible phase transitions...

The authors present results of studies on commercially available silver nanoparticles fabricated by Amepox Microelectronics and delivered in the form of silver powder. The studies were carried out by scanning electron microscopy (SEM), energy dispersive X-ray analysis (EDX) and scanning tunnelling microscopy (STM). Chemical analysis performed with the use of EDX revealed that the powder contain...

The adsorption of naphthalene tetracarboxylic diimide (NTCDI) on Si(1 1 1)-7 × 7 is investigated through a combination of scanning tunnelling microscopy (STM), noncontact atomic force microscopy (NC-AFM) and density functional theory (DFT) calculations. We show that NTCDI adopts multiple planar adsorption geometries on the Si(1 1 1)-7 × 7 surface which can be imaged with intramolecular bond res...

We extend the orbital-dependent electron tunnelling model implemented within the three-dimensional (3D) Wentzel-Kramers-Brillouin (WKB) atom-superposition approach for simulating scanning tunnelling microscopy (STM) by including arbitrary tip orientations. The orientation of the tip is characterized by a local coordinate system centred on the tip apex atom obtained by a rotation with respect to...

scanning impedance microscopy (sim) is one of the novel scanning probe microscopy (spm) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (c–v) behavior of the interface and ac transport properties. the sim is an ordinary afm equip...

scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...