نتایج جستجو برای: reflectometry

تعداد نتایج: 2413  

1998
H. Wulff

TiNx films of about 50 nm thickness were deposited on silicon wafer using a hollow cathode arc evaporation device (HCAED) by variation of the discharge power. The films were investigated with grazing incidence asymmetric Bragg diffraction (GIABD) and grazing incidence reflectometry to get information about the plasma-wall interaction. Both methods were performed with a conventional SIEMJZNS D50...

2017
Rebecca Eells Marilia Barros Kerry M. Scott Ioannis Karageorgos Frank Heinrich Mathias Lösche

The structural characterization of peripheral membrane proteins represents a tremendous challenge in structural biology due to their transient interaction with the membrane and the potential multitude of protein conformations during this interaction. Neutron reflectometry is uniquely suited to address this problem because of its ability to structurally characterize biological model systems nond...

Journal: :Physical chemistry chemical physics : PCCP 2013
B Jerliu L Dörrer E Hüger G Borchardt R Steitz U Geckle V Oberst M Bruns O Schneider H Schmidt

Neutron reflectometry is used to study in situ the intercalation of lithium into amorphous silicon electrodes. The experiments are done using a closed three-electrode electrochemical cell setup. As a working electrode, an about 40 nm thick amorphous silicon layer is used that is deposited on a 1 cm thick quartz substrate coated with palladium as a current collector. The counter electrode and th...

Journal: :Optics express 2008
Yosuke Mizuno Weiwen Zou Zuyuan He Kazuo Hotate

We propose a Brillouin optical correlation-domain reflectometry (BOCDR), which can measure the distribution of strain and/or temperature along an optical fiber from a single end, by detecting spontaneous Brillouin scattering with controlling the interference of continuous lightwaves. In a pulse-based conventional Brillouin optical time-domain reflectometry (BOTDR), it is difficult in principle ...

2004
Leo Van Biesen Patrick Boets Frank Louage Tom Bostoen

− The Expert System, which is described in this paper, constitutes a fundamental unit of a general measurement system, which is capable to perform an xDSL (arbitrary Digital Subscriber Line) loop qualification by means of time-domain reflectometry (TDR). The goal of the measurement system is to estimate the theoretical channel capacity of the local loop, which connects the customer premises (CP...

Journal: :Light: Science & Applications 2016

Journal: :EPJ Web of Conferences 2020

Journal: :The Review of Laser Engineering 1995

Journal: :Review of Scientific Instruments 2006

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