نتایج جستجو برای: ray diffraction measurement then

تعداد نتایج: 1484604  

Journal: :Journal of the mechanical behavior of biomedical materials 2012
Kazuhiro Fujisaki Masahiro Todoh Atsushi Niida Ryota Shibuya Shunsuke Kitami Shigeru Tadano

Tooth enamel is the hardest material in the human body, and it is mainly composed of hydroxyapatite (HAp)-like mineral particles. As HAp has a hexagonal crystal structure, X-ray diffraction methods can be used to analyze the crystal structure of HAp in teeth. Here, the X-ray diffraction method was applied to the surface of tooth enamel to measure the orientation and strain of the HAp crystals. ...

Journal: :Journal of the Society of Materials Science, Japan 1972

2015
Tao Zhang Shifeng Jin Yuanxin Gu Yao He Ming Li Yang Li Haifu Fan

Serial femtosecond crystallography (SFX) is capable of collecting three-dimensional single-crystal diffraction data using polycrystalline samples. This may dramatically enhance the power of X-ray powder diffraction. In this paper a test has been performed using simulated diffraction patterns. The test sample is a mixture of two zeolites with crystal grain sizes from 100 to 300 nm. X-ray diffrac...

Journal: :international journal of nanoscience and nanotechnology 2012
a. ghasemi a. m. davarpanah m. ghadiri

oxide nanoparticles of fe-co-ni were prepared in six different compositions by co-precipitation method. the as-synthesized nanoparticles were characterized by x-ray diffraction (xrd), field emission scanning electron microscope (fesem), fourier transform infrared (ft-ir) and vibrating sample magnetometer  (vsm). it was found that the nanoparticles had mean crystalline size of 30-55 nm and spher...

Journal: :international journal of automotive engineering 0
honarvar gheysari babakhani haerian

shot peening applies a residual compressive stress field (rcsf) on the surface of parts. it also shifts “crack nucleation sites” to sub-surface locations. a nondestructive method of measuring the stresses, sin2ψ was utilized here and the stress values introduced to ansys software. for this purpose, uniform stress in all directions was applied on the con rod. loading on the rod in ansys had thre...

Journal: :علوم و تکنولوژی پلیمر 0
سعید داداشی سید محمد موسوی زهرا امام جمعه عبدالرسول ارومیه ای

physical, mechanical and structural properties of poly(lactic acid) (pla)-basedfilms containing different amounts of nanoclay and cellulose prepared bysolvent casting method were examined. physical properties including thickness,transparency and color did not change significantly with addition of nanoparticles to the polymer matrix. x-ray diffraction (xrd) patterns showed that pure pla has a se...

2015
Chufeng Li Kevin Schmidt John C. Spence

We compare three schemes for time-resolved X-ray diffraction from protein nanocrystals using an X-ray free-electron laser. We find expressions for the errors in structure factor measurement using the Monte Carlo pump-probe method of data analysis with a liquid jet, the fixed sample pump-probe (goniometer) method (both diffract-and-destroy, and below the safe damage dose), and a proposed two-col...

Journal: :Chemistry 2010
Karen L Mulfort Omar K Farha Christos D Malliakas Mercouri G Kanatzidis Joseph T Hupp

A new, twofold interpenetrated metal-organic framework (MOF) material has been synthesized that demonstrates dramatic steps in the adsorption and hysteresis in the desorption of CO(2). Measurement of the structure by powder X-ray diffraction (PXRD) and pair distribution function (PDF) analysis indicates that structural changes upon CO(2) sorption most likely involve the interpenetrated framewor...

2008
Weike Lu Z. J. Pei J. G. Sun

The Subsurface Damage (SSD) in silicon wafers induced by any mechanical material-removal processes has to be removed by subsequent processes. Therefore, the measurement of SSD is critically important for cost-effective manufacturing of silicon wafers. This review paper presents several Non-Destructive Evaluation (NDE) methods for SSD in silicon wafers, including X-ray diffraction, micro-Raman s...

2004
E. M. Rehder S. Iyer

High volume HBT (Heterojunction Bipolar Transistor) production benefits from non-destructive measurement techniques to verify the quality of every product wafer. X-ray diffraction is non-destructive and sensitive to layer thicknesses and compositions. The thin layers typical of HBT designs yield weak diffraction intensity, which are overwhelmed by the signal from the substrate in the convention...

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