نتایج جستجو برای: quasi floating gate

تعداد نتایج: 145973  

2013
Sukhvir Kaur Parminder Singh Jassal

Floating point arithmetic is widely used in many areas, especially scientific computation and signal processing. The main applications of floating points today are in the field of medical imaging, biometrics, motion capture and audio applications. The IEEE floating point standard defines both single precision and double precision formats. Multiplication is a core operation in many signal proces...

2005
J. W. Wu J. W. You Tahui Wang

Abnormal increase of low frequency flicker noise in analog nMOSFETs with gate oxide in valence band tunneling domain is investigated. In 15Å oxide devices, valence-band electron tunneling from Si substrate to poly-gate occurs at a positive gate voltage and results in the splitting of electron and hole quasi Fermi-levels in the channel. The excess low frequency noise is attributed to electron an...

2004
Peter Celinski Said Al-Sarawi Derek Abbott

A model for the delay of neuron-MOS (neuMOS) and Capacitive Threshold-Logic (CTL) based logic circuits is presented for the first time. It is based on the analysis of the basic neuron-MOS [l] and CTL gate structures [a]. A closed form analytic expression for the delay of the threshold gate is derived. A relation for the delay in terms of an ordinary CMOS inverter delay expressed as a function o...

2014
Ko-Hui Lee Jung-Ruey Tsai Ruey-Dar Chang Horng-Chih Lin Tiao-Yuan Huang

Articles you may be interested in Electronic transport mechanisms in scaled gate-all-around silicon nanowire transistor arrays Appl. Enhancement of programming speed on gate-all-around poly-silicon nanowire nonvolatile memory using self-aligned NiSi Schottky barrier source/drain High-performance gate-all-around polycrystalline silicon nanowire with silicon nanocrystals nonvolatile memory Appl. ...

Journal: :International Journal of Electronics Signals and Systems 2013

Journal: :IEEE Transactions on Quantum Engineering 2021

Journal: :IEEE Transactions on Device and Materials Reliability 2012

2009
S. Paydavosi V. Bulović C. W. Cheng

Conventional flash memories may reach fundamental scaling limits [1] because of the minimum tunnel oxide thickness and poor charge retention due to defects in the tunneling oxide, necessitating new approaches to meet the scaling requirements while simultaneously meeting the reliability and performance requirements of future products. In this study we demonstrate alternative nano-segmented float...

Journal: :Nano letters 2011
Xiaohui Tang Christophe Krzeminski Aurélien Lecavelier des Etangs-Levallois Zhenkun Chen Emmanuel Dubois Erich Kasper Alim Karmous Nicolas Reckinger Denis Flandre Laurent A Francis Jean-Pierre Colinge Jean-Pierre Raskin

We present a new fully self-aligned single-electron memory with a single pair of nano floating gates, made of different materials (Si and Ge). The energy barrier that prevents stored charge leakage is induced not only by quantum effects but also by the conduction-band offset that arises between Ge and Si. The dimensions and position of each floating gate are well-defined and controlled. The dev...

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