Designing highly dependable systems requires a good understanding of failure characteristics. Unfortunately, little raw data on failures in large IT installations is publicly available. This paper analyzes failure data recently made publicy available by one of the largest high-performance computing sites. The data has been collected over the past 9 years at Los Alamos National Laboratory and in...

In recent times in the business of semiconductor testing, the claim has been that Test Cost has begun to dominate the overall cost of product (die + packaging + test) in some product lines. The cost models that I have seen are simplistic models that just take into account the product yield and the per-second test cost. More recently, I have become even more concerned over the effects of Mean-Ti...

Modeling the reliability of distributed systems requires a good understanding of the reliability of the components. Careful modeling allows highly fault-tolerant distributed data applications to be constructed at the least cost. Failure and repair rates of components are o f e n assumed to be exponentially distributed. This hypothesis is testable f o r failure rates, though the process of gathe...

Monolithic 3D technology is emerging as a promising solution that can bring massive opportunities, but the gains be hindered due to reliability issues exaggerated by high temperature. Conventional solutions focus on one specific feature and assume other required features would provided different solutions. Hence, this assumption has resulted in are proposed isolation of each fail consider overa...

A complex repairable computer-based test (CBT) network system studied in this paper consists of three client computers, a load balancer, two database servers, with the centralized server structured series configuration. Subsystem 1 homogeneous clients arranged parallel configuration, subsystem 2 comprises 3 is comprised distributed servers arrangement and 4 server. Through transition diagram, f...

Due to the expected increase of defects in circuits based on deep submicron technologies, reliability has become an important design criterion. Although different approaches have been developed to estimate reliability in digital circuits and some measuring concepts have been separately presented to reveal the quality of analog circuit reliability in the literature, there is a gap to estimate re...

We consider the simulation of transient performance measures of high reliable faulttolerant computer Systems. The most widely used mathematical tools to model the behavior of these Systems are Markov processes. Here, we deal basically with the simulation ofthe mean time tofailure (MTTF) and the reliability, R(t), ofthe system at time t Some variance réduction techniques are used to reduce the s...

In this paper, Investigations have been carried out for the evaluation of reliability in three different cases i.e., if each component complex system is R, failure rates follow Weibull time distribution & Exponential and MTTF a sugar manufacturing plant by using Boolean function technique. The under consideration which consists various subsystems viz., washing, cane cutter, crushing system,...