نتایج جستجو برای: diffractometer
تعداد نتایج: 1342 فیلتر نتایج به سال:
A microfluidic platform was used to address the problems of obtaining diffraction-quality crystals and crystal handling during transfer to the X-ray diffractometer. Crystallization conditions of a protein of pharmaceutical interest were optimized and X-ray data were collected both in situ and ex situ.
Semiconductor substrates made from single crystal materials need to be cut precisely along a fixed axis during the manufacturing process of the semiconductor components. Thus, measuring the crystal orientation is critical. For these measurements, Xray techniques demonstrate the highest precision. This report presents an outline of two popular X-ray diffraction techniques, the diffractometer and...
generally arranged at a distance of 0.1 nm to 0.5 nm from one another. When such a substance is irradiated with X-rays having a wavelength roughly equivalent to the interatomic or intermolecular distance, the Xray diffraction phenomenon will take place. X-ray diffraction is widely used in the semiconductor field because it is nondestructive and yields crystal structure information relatively ea...
The results of single-site and many-site measurements of cell dimensions from single crystals are compared for Bond and four-circle diffractometers using samples of corundum (essentially pure rhombohedral alpha-Al2O3, aluminum oxide) of high diffraction quality, where the effects of small changes in temperature and composition (Cr2O3, chromium oxide, in solid solution) can be taken into account...
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