the aim of this paper is to review the created problems and failure of environmental design patterns in designing process by designers. not respectfully addressing the context of environment during designing process have resulted in the loss quality of environment, damage to both nature and essence of environment as manifested in the case study area. methodology of the research was based on the...

Constructing free-form buildings is very complex due to the difficulty in fabricating curved façade. To install façade, geometric shapes of façade need be divided into panels. The panels developed are classified three categories terms their curvatures, i.e., planar, single-curved, double-curved quality determined by difference between as-built and as-designed panel shapes. Among types panels, d...

The generation of significant power droop (PD) during at-speed test performed by Logic BIST is a serious concern for modern ICs. In fact, the PD originated during test may delay signal transitions of the circuit under test (CUT): an effect that may be erroneously recognized as delay faults, with consequent erroneous generation of test fails, and increase in yield loss. In this paper, we propose...

We present a new low-power BIST (built-in-self-test) for sequential circuits. State correlation analysis is first performed on the flip-flop values in the relaxed, compacted sequence for the undetected faults to extract spatial correlations among the flip-flops. The extracted spatial correlation matrix not only provides additional metrics through which the scan order may be altered, but also al...

This paper presents AutoGUI, a Template Haskell library for automatic form generation. A form is a part of graphical user interface (GUI) restricted to displaying a value and allowing the user to modify it and then either accept changes or abandon them. The library is built on top of medium-level GUI library wxHaskell. The Template Haskell and Haskell type system allow the forms to be built ful...

Many believe that in-field hardware faults are too rare in practice to justify the need for Logic Built-In Self-Test (LBIST) in a design. Until now, LBIST was primarily used in safety-critical applications. However, this may change soon. First, even if costly methods like burn-in are applied, it is no longer possible to get rid of all latent defects in devices at leadingedge technology. Second,...

We present a methodology to detect and measure the signal overshoots occurring on the interconnects of high-speed system-on-chips. Overshoots are known to inject hot-carriers into the gate oxide which cause permanent degradation of MOSFET transistors’ performance over time. We propose a built-in chip mechanism to detect overshoots, collect the occurrence information and scan them out efficientl...

This technical report contains the text of Nur Touba's thesis "Synthesis Techniques for Pseudo-Random Built-In Self-Test." The thesis appendices have appeared as CRC Technical Reports, and are not included here.

This work introduces a new board-level test technology based on specific synthesizable embedded instruments. The purpose of intelligent embedded instrument is to carry out a vast portion of test application related procedures, perform measurement and configuration of system components thus minimizing the usage of external test equipment. By replacing traditional test and measurement equipment w...