نتایج جستجو برای: atomic force microscopy
تعداد نتایج: 425871 فیلتر نتایج به سال:
the scanning probe microscopes (spms) based lithographic techniques have been demonstrated as an extremely capable patterning tool. manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. in this paper, a qualified overview of diverse lithog...
Atomic force microscopy or AFM is a method to see a surface in its full, three-dimensional glory, down to the nanometer scale. The method applies to hard and soft synthetic materials as well as biological structures (tissues, cells, biomolecules), irrespective of opaqueness or conductivity. The 3D object is not perceived in the usual way, that is, by line-of-sight, reflections or shadows. (Or, ...
Intense interest in nanoscale science and technology has been the main driving force behind a large number of outstanding discoveries in the last few decades. It may not be an overstatement to claim that the development of the various scanning probe methods in the 1980s was the main pre-requisite for the fields of nanoscience and nanotechnology to take off and ultimately evolve to their current...
Atomic Force Microscopy (AFM) techniques are used with oneor two-dimensional arrays of piezoresistive probes for parallel imaging. We present a newly designed AFM platform to drive these passivated piezoresistive cantilever arrays in air and liquid environments. Large area imaging in liquid as well as qualitative and quantitative analysis of biological cells are demonstrated by the means of pie...
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