نتایج جستجو برای: atomic force microscope afm

تعداد نتایج: 302535  

Journal: :Langmuir : the ACS journal of surfaces and colloids 2005
Steven L Carnie Derek Y C Chan Craig Lewis Rogério Manica Raymond R Dagastine

Recent experimental developments have enabled the measurement of dynamical forces between two moving liquid drops in solution using an atomic force microscope (AFM). The drop sizes, interfacial tension, and approach velocities used in the experiments are in a regime where surface forces, hydrodynamics, and drop deformation are all significant. A detailed theoretical model of the experimental se...

2012
Magdalena Huefner Adam Pivonka Jeehoon Kim Cun Ye Martin A. Blood-Forsythe Martin Zech Jennifer E. Hoffman

We introduce a versatile method to control the quality factor Q of a conducting cantilever in an atomic force microscope (AFM) via capacitive coupling to the local environment. Using this method, Q may be reversibly tuned to within 10% of any desired value over several orders of magnitude. A point-mass oscillator model describes the measured effect. Our simple Q control module increases the AFM...

Journal: :Croatica chemica acta. Arhiv za kemiju 2008
Vedrana Montana Wei Liu Umar Mohideen Vladimir Parpura

Relatively recently, the Atomic Force Microscope (AFM) emerged as a powerful tool for single molecule nanomechanical investigations. Parameters that can be measured by force spectroscopy using AFM, such as the force and total mechanical extension required to break bonds between various proteins can yield valuable insights into the nature of the bond (zippering vs. highly localized binding site)...

2013
X. Tang X. Li Y. Wang K. Wepasnick A. Lim D. H. Fairbrother K. H. Bowen A. K. Kandalam

Size selected metal oxide, sulfide and oxynitride clusters, soft-landed onto highly ordered pyrolytic graphite (HOPG) at room temperature, have been studied in this work. Based on their size and chemical compositions, the deposited clusters have exhibited various surface structures as illustrated by in situ Scanning Tunnelling Microscope (STM) and ex situ Atomic Force Microscope (AFM). In contr...

Journal: :Nanotechnology 2008
Vladimir V Dobrokhotov Mehdi M Yazdanpanah Santosh Pabba Abdelilah Safir Robert W Cohn

A calibrated method of force sensing is demonstrated in which the buckled shape of a long flexible metallic nanowire, referred to as a 'nanoneedle', is interpreted to determine the applied force. An individual needle of 157 nm diameter by 15.6 µm length is grown on an atomic force microscope (AFM) cantilever with a desired orientation (by the method of Yazdanpanah et al 2005 J. Appl. Phys. 98 0...

Journal: :Physical Review Letters 1986

2007
F. Kienberger A. Ebner L. Chtcheglova L. Wildling T. Puntheeranurak H. J. Gruber

The high force sensitivity of the atomic force microscope (AFM) has opened the possibility of measuring interand intramolecular forces of biomolecules on the single molecule level. Covalent binding of bioligands to AFM tips converts them into monomolecular biosensors by which cognate receptors can be localized on the sample surface and fine details of ligand-receptor interaction can be studied....

Journal: :Science 2008
S K Kufer E M Puchner H Gumpp T Liedl H E Gaub

We introduce a method for the bottom-up assembly of biomolecular structures that combines the precision of the atomic force microscope (AFM) with the selectivity of DNA hybridization. Functional units coupled to DNA oligomers were picked up from a depot area by means of a complementary DNA strand bound to an AFM tip. These units were transferred to and deposited on a target area to create basic...

2005
Cheng-Hung Chen

The atomic force microscope (AFM) is one of the most important tools for measuring atomic resolution. The AFM system maintains constant force between a tip and the sample in order to track the sample topography. The controller that maintains the constant interaction force plays a significant role in measurement accuracy. This paper presents a μ-synthesis controller design to deal with model unc...

2001
Ming Zhang David Bullen Kee S. Ryu Chang Liu Seunghun Hong Sung-Wook Chung Chad A. Mirkin

The development of passive and active atomic force microscope (AFM) probe arrays is reported in this paper. The devices are specifically designed to work with Dip-Pen Nanolithography and are fabricated using MEMS micromachining techniques. These devices can generate sub-100nm patterns in a high speed, parallel, and controllable fashion.

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