نتایج جستجو برای: atomic force microscope

تعداد نتایج: 298371  

2008
John H. Cantrell Sean A. Cantrell

An analytical model is developed of the interaction of the cantilever tip of an atomic force microscope with the sample surface that treats the cantilever and sample as independent systems coupled by a nonlinear force acting between the cantilever tip and a volume element of the sample surface. To maintain equilibrium, the volume element is subjected to a restoring force from the remainder of t...

Journal: :TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 2005

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