نتایج جستجو برای: assembled cantilever probe
تعداد نتایج: 134149 فیلتر نتایج به سال:
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple modes in a frequency comb. A high-quality factor cantilever resonance and a suitable drive comb will result in tip motion described by a narrow-band frequency comb. We show, by a separation of time scales, that such mot...
Ligand molecules for a particular receptor can be attached to the tip of an AFM probe, transforming the probe into a sensitive, chemically selective biosensor for that receptor [Riener et al. 2003]. Molecular recognition force microscopy (MRFM) is a single-molecule AFMbased technique that relies heavily on nanoscale surface chemistry, nanoscale biochemical immobilization chemistry, and bioconju...
Ligand molecules for a particular receptor can be attached to the tip of an AFM probe, transforming the probe into a sensitive, chemically selective biosensor for that receptor [Riener et al. 2003]. Molecular recognition force microscopy (MRFM) is a single-molecule AFMbased technique that relies heavily on nanoscale surface chemistry, nanoscale biochemical immobilization chemistry, and bioconju...
We present a new type of cryogenic local velocity probe that operates in liquid helium (1 K < T < 4.2 K) and achieves a spatial resolution of ≈ 0.1 mm. The operating principle is based on the deflection of a micro-machined silicon cantilever which reflects the local fluid velocity. Deflection is probed using a superconducting niobium micro-resonator sputtered on the sensor and used as a strain ...
For advanced atomic force microscopy (AFM) investigation of chemical surface modifications or very soft organic sample surfaces, the AFM probe tip needs to be operated in a liquid environment because any attractive or repulsive forces influenced by the measurement environment could obscure molecular forces. Due to fluid properties, the mechanical behavior of the AFM cantilever is influenced by ...
Enhancing the short-term force precision of atomic force microscopy (AFM) while maintaining excellent long-term force stability would result in improved performance across multiple AFM modalities, including single molecule force spectroscopy (SMFS). SMFS is a powerful method to probe the nanometer-scale dynamics and energetics of biomolecules (DNA, RNA, and proteins). The folding and unfolding ...
Amajor limitation for future nanotechnology, particularly for bottom-up manufacturing is the non-availability of 2-dimensional massively parallel probe arrays. Scanning proximity probes are uniquely powerful tools for analysis, manipulation and bottom-up synthesis: they are capable of addressing and engineering surfaces at the atomic level and are the key to unlocking the full potential of Nano...
In this work we present a method for tip-sample distance control in probe microscopy and probe recording by using field emission current detection as a feedback signal. Field emission currents flow when a large enough electric field is applied between the probe tip and the recording medium. The current varies exponentially with the applied electric field, which in turn is more or less proportio...
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic) topographical analysis, applicable to both conducting and nonconducting surfaces. The basic imaging principle is very simple: a sample attached to a piezoelectric positioner is rastered beneath a sharp tip attached to a sensitive cantilever spring. Undulations in the surface lead to deflection o...
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