نتایج جستجو برای: analogue simulation

تعداد نتایج: 599823  

2003
Guido Stehr Michael Pronath Frank Schenkel Helmut Graeb Kurt Antreich

We present a novel technique to automatically calculate an initial sizing of analog circuits that conforms to good design practice. The method is purely (DC) simulation-based and does not need symbolic design equations or user design knowledge. It identifies the space of feasible design parameters based on implicit specifications, which arise from the circuit topology. A sizing centered within ...

2003
Haralampos-G. D. Stratigopoulos Yiorgos Makris

We present a novel methodology for concurrent error detection in linear analog circuits. We develop a rigorous theory that yields an error detection circuit of size that is, in general, much smaller than a duplicate of the circuit under test. The error detection circuit monitors the input and some judiciously selected observable internal nodes of the examined circuit to produce an estimate of i...

2003
Xiangli Li Huadian Pan Bogdan M. Wilamowski

Operation of the gate-controlled punch through transistor is demonstrated in this paper. The characteristics of the device are simulated using SILVACO atlas device simulator. This device shows high voltage, high operation frequency, and low noise properties. This punch through device can be used in high power control circuit, and also can be used for fast analog circuits for multiplication, squ...

2007
K. Iniewski T. Salama

Models for analog circuit simulations must achieve good and continuous representation of current through the device over the complete range of modes of operation including saturation and weak, moderate and strong inversion. In addition the drain current and its derivatives must be continuous to avoid convergence problems and give proper description of the transconductance and output conductance...

2017
Davit Mirzoyan Ararat Khachatryan

A process corner monitoring circuit (PCMC) is presented in this work. The circuit generates a signal, the logical value of which depends on the process corner only. The signal can be used in both digital and analog circuits for testing and compensation of process variations (PV). The presented circuit uses only metal-oxidesemiconductor (MOS) transistors, which allow increasing its detection acc...

Journal: :The Iowa Review 1994

1996
Philbert Bangayan Abeer Alwan Shrikanth S. Narayanan

Articulatory patterns of the lateral approximant /1/, both dark and light allophones, in American English were analyzed through magnetic resonance imaging (MRI) and electropalatography (EPG). Vocal tract lengths, area functions, and cavity volumes, were measured from the MR images, while EPG data were used for studying interand intra-speaker variabilities in lingua-palatal contact patterns. Aco...

2007
ELENA NICULESCU

An approach of the worst case analysis of the analog electronic circuits based on the circuit description in parameter space is proposed. A DC, AC or transient worst-case analysis can be performed only testing the circuit for the vertices of a polytope in conjunction with a circuit simulator or computational environment. In order to validate and show the effectiveness of this approach, DC worst...

2001
P. Adell R. D. Schrimpf H. J. Barnaby O. Mion

A new methodology for understanding single-event transient (SET) phenomena in analog circuits is described. Device and circuit simulation techniques are coupled in order to reproduce experimental data obtained from the National Semiconductor LM124 operational amplifier and to determine the most sensitive parts of the integrated circuit. Experimental data obtained at the Physical Nuclear Institu...

1998
Jatan C. Shah Ahmed A. Younis Sachin S. Sapatnekar Marwan M. Hassoun

This paper presents an event-driven algorithm and its symbolic implementation for the analysis of power and ground bus networks. The algorithm uses frequency domain techniques and moment matching approaches based on Pad e approximants to estimate the transfer function at each node in the P/G network. Afterwards, the transient waveforms are extracted for each node. The process requires repetitiv...

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