نتایج جستجو برای: afm و xrd

تعداد نتایج: 790328  

2015
C. Parthiban N. Sundaramurthy

The synthesis of semiconductor nanoparticles is an expanding research area due to the potential applications in the development of nanotechnologies. Especially, biosynthesized nanoparticles have become an important branch of nanotechnology. In the present work, we describe a low-cost and simple procedure for biosynthesis of Zinc oxide nanoparticles (ZnO NPs) using Pyrus Pyrifolia leaf extract. ...

2016
Ming Xiao Jincheng Zhang Xiaoling Duan Hengsheng Shan Ting Yu Jing Ning Yue Hao

We have discussed a new crystal epitaxial lateral overgrowth (ELO) method, partly-contacted ELO (PC-ELO) method, of which the overgrowth layer partly-contacts with underlying seed layer. The passage also illustrates special mask structures with and without lithography and provides three essential conditions to achieve the PC-ELO method. What is remarkable in PC-ELO method is that the tilt angle...

2012
Rasha Ali Hussein

In this study, Four Wave Mixing (FWM) characteristics in photonic crystal fibers are investigated. The effect of channel spacing, phase mismatching, and fiber length on FWM efficiency have been studied. The variation of idler frequency which obtained by this technique with pumping and signal wavelengths has been discussed. The effect of fiber dispersion has been taken into account; we obtain th...

2008
Amir Kabir M. Jaberi M. R. Meybodi

يمومع باي تيعقوم متسيس كي تقد 3 رد متسيس وردوخ يربوان ياه يم ريثأت يفلتخم لماوع زا زا تـسا مزلا لـيلد نيمه هب و دريذپ شور دومن هدافتسا وردوخ هدش نييعت تيعقوم رد تقد شيازفا تهج هشقن قيبطت ياه . متسيس رد هشقن قيبطت وردوـخ يربواـن ياـه دراد هدهع رب ار رهش هشقن يوررب وردوخ يلعف تيعقوم نييعت هفيظو . رد هـشقن قيبطت هلأسم لح يارب يبيكرت متيروگلا كي هلاقم نيا متسيس رد يم داهنشيپ وردوخ يربوان يا...

Journal: :Applied sciences 2023

The aim of this work is to assess the crystalline structure modification an SLM Co-Cr-W dental alloy, veneered with two different ceramics, by means X-ray diffraction (XRD), atomic force microscopy (AFM), and scanning electron microscopy, coupled energy-dispersive spectroscopy (SEM-EDS). Ten identical plates were fabricated using subsequently subjected ceramic veneering. Following repeated firi...

2012
Peihong Wang Hejun Du Shengnan Shen Mingsheng Zhang Bo Liu

Zinc oxide [ZnO] thin films are deposited using a radiofrequency magnetron sputtering method under room temperature. Its crystalline quality, surface morphology, and composition purity are characterized by X-ray diffraction [XRD], atomic force microscopy [AFM], field-emission scanning electron microscopy [FE-SEM], and energy-dispersive X-ray spectroscopy [EDS]. XRD pattern of the ZnO thin film ...

2004
H. C. Yao W. T. Wu M. C. Chiu F. S. Shieu

Titanium oxide (TiO2) thin films were deposited by RF magnetron sputtering on Si and glass substrates. The microstructure, surface morphology, and optical properties of the thin films were investigated by grazing incidence X-ray diffraction (GIXD), transmission electron microscopy (TEM), field emission scanning electron microscopy (FE-SEM), atomic force microscopy (AFM), and UV/VIS spectrophoto...

2017
Y E Firat H Yildirim K Erturk A Peksoz

Polycrystalline copper sulphide (Cu x S) thin films were grown by ultrasonic spray pyrolysis method using aqueous solutions of copper chloride and thiourea without any complexing agent at various substrate temperatures of 240, 280, and 320°C. The films were characterized for their structural, optical, and electrical properties by X-ray diffraction (XRD), scanning electron microscopy (SEM), ener...

Journal: :Yakugaku zasshi : Journal of the Pharmaceutical Society of Japan 1970
N Ikeda A Yada K Takase

ةصلاخلا بكرملل ةدیدج تاقتشم ریضحت ىلا ثحبلا يمری 4,3,1 ةیتلاا تلاعافتلا ءارجا للاخ نم لوزایادایاث : ًلاوأ : ب كرملل فیش ةدعاق ریضحت ) 2 و نیما 5 و تبكرم 4,3,1 لوزا یادایاث ( يلیفو یلكوینلا ضیو عتلا ءارجاو ةدعاقلل يرتسلاا ب كرملا نیو كت ى لا يدؤ یل مویدو صلا دیسكوثیا دو جوب ل ثیلاا تاتیسا ومورب عم ) 3 ( ، يذ لا یازاردیھلا عم ھتلعافم تمت ن 99 % د یازاردیھلا قتشم ریضحتل ) 4 ( فیش دعاوق نم د یدع...

2014
Satoru Kaneko Hironori Torii Takao Amazawa Takeshi Ito Manabu Yasui Masahito Kurouchi Akinori Fukushima Takashi Tokumasu Seughwan Lee Sungkyun Park Hirofumi Takikawa Mamoru Yoshimoto

Wurzite aluminum nitride is prepared on a c-plane sapphire substrate by electron cyclotron resonance plasma-enhanced sputtering deposition (ECR sputtering). Atomic force microscopy (AFM) showed flat AlN thin-film surfaces, and X-ray diffraction (XRD) analysis verified the epitaxial growth of AlN films with the full-width at half-maximum (FWHM) of the rocking curve of 0.025 deg on the film with ...

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