In many real applications, the input data are naturally expressed as tensors, such as virtual metrology in semiconductor manufacturing, face recognition and gait recognition in computer vision, etc. In this paper, we propose a general optimization framework for dealing with tensor inputs. Most existing methods for supervised tensor learning use only rank-one weight tensors in the linear model a...

We report on advances in ac voltage metrology made possible by a new generation of Multijunction Thermal Converters (MJTCs). Although intended for use primarily in highfrequency (1 MHz to 100 MHz) metrology, their exceptional low-frequency qualities, combined with a large dynamic range, makes these MJTCs excellent devices for the frequency range 10 Hz to 100 MHz at voltages from 1 V to 20 V, de...

We describe nonlinear quantum atom–light interfaces and nonlinear quantum metrology in the collective continuous variable formalism. We develop a nonlinear effective Hamiltonian in terms of spin and polarization collective variables and show that model Hamiltonians of interest for nonlinear quantum metrology can be produced in 87Rb ensembles. With these Hamiltonians, metrologically relevant ato...

In a previous paper, the University of Arizona (UA) has developed a measurement technique called: Software Configurable Optical Test System (SCOTS) based on the principle of reflection deflectometry. In this paper, we present results of this very efficient optical metrology method applied to the metrology of X-ray mirrors. We used this technique to measure surface slope errors with precision an...

Uniform sampling in metrology has known drawbacks such as coherent spectral aliasing and a lack of efficiency in terms of measuring time and data storage. The requirement for intelligent sampling strategies has been outlined over recent years, particularly where the measurement of structured surfaces is concerned. Most of the present research on intelligent sampling has focused on dimensional m...

A novel cable-based metrology system is presented wherein six cables are connected in parallel from ground-mounted string pots to the moving object or tool of interest. Cartesian pose can be determined for feedback control and other purposes by reading the lengths of the six cables via the string pots and using closed-form forward pose kinematics. This article focuses on a sculpting metrology t...

Quantum states of light, such as squeezed states or entangled states, can be used to make measurements (metrology), produce images, and sense objects with a precision that far exceeds what is possible classically, and also exceeds what was once thought to be possible quantum mechanically. The primary idea is to exploit quantum effects to beat the shot-noise limit in metrology and the Rayleigh d...

The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We employ these schemes to compare an FIR and an IIR approach for compensating a second-order LTI s...

A survey has been performed to determine the measurement requirements of space power related parameters for anticipated SDI systems. These requirements have been compared to present state-of-the-art metrology capabilities as represented by the calibration capabilities of the National Institute of Standards and Technology. Metrology areas where present state-of-the-art capabilities are inadequat...

This paper presents an overview of foundational concepts and techniques used in metrology of form errors such as straightness, flatness, circularity, sphericity, and cylindricity. While there exists a significant body of literature on form-error metrology, to the best of our knowledge, no review paper has been written on this topic. Our aim here is to (i) present a unified view of the mathemati...