نتایج جستجو برای: transmission electron microscopy tem

تعداد نتایج: 631869  

2010
A Espíndola-Gonzalez AL Martínez-Hernández C Angeles-Chávez VM Castaño C Velasco-Santos

The synthesis of nanoparticles silica oxide from rice husk, sugar cane bagasse and coffee husk, by employing vermicompost with annelids (Eisenia foetida) is reported. The product (humus) is calcinated and extracted to recover the crystalline nanoparticles. X-ray diffraction (XRD), transmission electron microscopy (TEM), high-resolution transmission electron microscopy (HRTEM) and dynamic light ...

2001
C. J. Nicklaw M. P. Pagey S. T. Pantelides D. M. Fleetwood R. D. Schrimpf K. F. Galloway J. E. Wittig B. M. Howard

Electrical charge-trapping characteristics have been studied in thermal oxides that were implanted with Si, experimentally using electron spin resonance (ESR), capacitance versus voltage (CV) measurements, transmission electron microscopy (TEM), atomic force microscopy (AFM), and theoretically with Density Functional Theory (DFT) using plane waves. Our study examines possible defect structures ...

2013
EZEKIEL DIXON DIKIO ABDULLAHI MOHAMED FARAH

Metal organic frameworks (MOFs) of copper and zinc synthesized with 1,4benzenedicarboxylic acid and N,N-dimethylformamide at room temperature and by solvothermal method is reported in this paper. The MOFs were characterized by Fourier transform infrared spectroscopy (FTIR), Scanning electron microscopy (SEM), High resolution transmission electron microscopy (HR-TEM), X-ray diffraction (XRD) and...

2017
Nicolas Crespo-Monteiro Anthony Cazier Francis Vocanson Yaya Lefkir Stéphanie Reynaud Jean-Yves Michalon Thomas Kämpfe Nathalie Destouches Yves Jourlin

The microstructuring of the distribution of silver nanoparticles (NPs) in mesoporous titania films loaded with silver salts, using two-beam interference lithography leading to 1 Dimension (1D) grating, induces variations in the photocatalytic efficiency. The influence of the structuration was tested on the degradation of methyl blue (MB) under ultraviolet (UV) and visible illumination, giving r...

2016
Lluís Yedra Santhana Eswara David Dowsett Tom Wirtz

Isotopic analysis is of paramount importance across the entire gamut of scientific research. To advance the frontiers of knowledge, a technique for nanoscale isotopic analysis is indispensable. Secondary Ion Mass Spectrometry (SIMS) is a well-established technique for analyzing isotopes, but its spatial-resolution is fundamentally limited. Transmission Electron Microscopy (TEM) is a well-known ...

2007
C. T. K.-H. Stadtländer

Electron Microscopy (EM) is an important viewing technique for the study of microorganisms. More specifically, Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) are extremely useful tools for the ultrastructural examination of prokaryotic cells as well as for the study of the interaction between bacterial pathogens and host cells. Perhaps one of the most interesting ...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 1999
Isabell Fischione O'Keefe Guruz Dravid

: The effectiveness of applying a high-frequency, low-energy, reactive gas plasma for the removal of hydrocarbon contamination from specimens and components for electron microscopy has been investigated with a variety of analytical techniques. Transmission electron microscopy (TEM) analysis of specimens that have been plasma cleaned shows an elimination of the carbonaceous contamination from th...

Journal: :Cold Spring Harbor protocols 2013
Mark J West

Ultrastructural features of cells can be fractions of a micrometer in diameter, and electron microscopy is needed to resolve them to a degree that is compatible with stereological techniques. Because the focal depth of transmission electron microscopy (TEM) images is thousands of times greater than the thickness of the sections used with TEM, virtual sectioning of sections suitable for TEM is n...

Journal: :Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2005
Christian Kübel Andreas Voigt Remco Schoenmakers Max Otten David Su Tan-Chen Lee Anna Carlsson John Bradley

Electron tomography is a well-established technique for three-dimensional structure determination of (almost) amorphous specimens in life sciences applications. With the recent advances in nanotechnology and the semiconductor industry, there is also an increasing need for high-resolution three-dimensional (3D) structural information in physical sciences. In this article, we evaluate the capabil...

2009
Klaus van Benthem Stephen J. Pennycook

Transmission electron microscopy (TEM) is one of the most frequently used tools for the characterization of nanomaterials. Aberration-correction has revolutionized the field of electron microscopy and now equipment is commercially available providing sub-Gngström resolution and single atom sensitivity for atomic, electronic, and chemical structure analyses. In this entry, aberration-corrected s...

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