To perform a capacitive current switching test (CCT) at AC extra-high-voltage (EHV) and above level, this paper proposes new multi-transformer synthetic circuit (MTSC) method that replaces the general using capacitor banks. An MTSC has simpler structure compared to other testing methods higher equivalence (especially recovery voltage TRV) validity. Using method, CCTs for breakers (CBs) of 420 k...

Synthetic circuits embedded in host cells compete with cellular processes for limited intracellular resources. Here we show how funnelling of cellular resources, after global transcriptome degradation by the sequence-dependent endoribonuclease MazF, to a synthetic circuit can increase production. Target genes are protected from MazF activity by recoding the gene sequence to eliminate recognitio...

The TASBE (A Tool-Chain to Accelerate Synthetic Biological Engineering) project [2] developed a tool-chain (Figure 1) to design and build synthetic biology systems. These tools convert a circuit description written in a high-level language to an implementation in cells, assembled with laboratory robots. Each tool addresses a di↵erent sub-problem. This paper describes each tool and its key results.

We designed a synthetic riboswitch containing an OFF and an ON riboswitch units fused in tandem. The resulting complex riboswitch functions as a chemical band-pass filter circuit.

With increasingly stringent requirements for memory test, the complexity of the test algorithm is increasing. This will make BIST (Build-In-Self-Test) circuit more complex and the area of BIST circuit larger. This paper proposes a novel controllable BIST circuit. The controllable BIST circuit provides a cost-effective solution that supports a variety of March algorithms and SRAM embedded testin...

When test vectors are applied to a circuit, the fault coverage increases. The rate of increase, however, could be circuit-dependent. In fact, the actual rise of fault coverage depends on the characteristics of vectors, as well as, on the circuit. The paper shows that the average fault coverage can be computed kom circuit testability. A relationship between fault coverage and circuit testability...