Detailed spectral analysis of photon scanning tunneling microscope images has been carried out. The analysis of spectral mode-beat phenomena leads to an accurate determination of modeprofiles and gives evidence of counterpropagating modes.

We have carried out a density functional study of vibrationally inelastic tunneling in the scanning tunneling microscope of acetylene on copper. Our approach is based on a many-body generalization of the Tersoff-Hamann theory. We explain why only the carbon-hydrogen stretch modes are observed in terms of inelastic and elastic contributions to the tunneling conductance. The inelastic tunneling i...

The first electron microscope was designed in 1931 by Ernest Ruska, as his diploma thesis at the Faculty of Engineering in Berlin; it was designed on the bases of Busch’s theory about electronic lens. (Fg.1). The microscope had magnification of only 17 times. In his doctoral dissertation in 1933 Ernest Ruska developed a new electron microscope with three electromagnetic lenses. The magnificatio...

scanning hall probe microscopy (shpm) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. this method is based on application of the hall effect, supplied by a micro hall probe attached to the end of cantilever as a sensor.  shpm provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...

Tunneling spectroscopy has been used to detect the photoexcitation of charge carriers in the wide band-gap semiconductors, ZnO and cubic SiC. Because the process is energy sensitive, valence-toconduction hand or defect charge transfer transitions may be selectively excited and detected with the scanning tunneling microscope. Two types of transitions were detected which change the tunneling resp...

Some novel micro/nano-moiré methods have been developed at the Failure Mechanics Lab in Tsinghua University. This paper offers an introduction of these new methods, which can be realized under focus ion beam (FIB) system,scanning electron microscope (SEM), atomic force microscope (AFM), scanning tunneling microscope(STM) as well as laser scanning confocal microscope (LSCM). These micro/nano-moi...