Diffraction limits standard optical microscopy to a spatial resolution of about half the wavelength of light. We present novel microscopy techniques for imaging semiconductor materials and devices at better than diffraction-limited spatial resolution and observe previously inaccessible phenomena. We discuss the methods and results for Numerical Aperture Increasing Lens (NAIL) and Near-field Sca...

We present the realisation of near-field spectroscopic measurements with fibre-tip-based scanning near-field microscopy. It allows simultaneous acquisition of near-field optical images in a broad spectral range (400 nm to 1000 nm), thus recovering local spectroscopic information. The technique is essential for understanding the resonant interaction of light with nanostructured objects as the fa...