THE transmission electron microscope was invented in Germany in 1932. It works by directing a beam of electrons through a specimen and then using a lens to enlarge the image formed by their passage. In Japan, development and research into its applications began in 1939, and numerous companies around the world have competed to develop the instruments since Hitachi developed its own fi rst transm...

The authors have developed an ultrahigh vacuum (UHV) variable-temperature four-tip scanning tunneling microscope (STM), operating from room temperature down to 7 K, combined with a scanning electron microscope (SEM). Four STM tips are mechanically and electrically independent and capable of positioning in arbitrary configurations in nanometer precision. An integrated controller system for both ...

in this paper, nano fibers (engelhard corporation titanosilicate number 10 / polyacrylonitrile) ets-10 / pan, as a composite exchanger to absorb heavy metals, were synthesized and optimized. several parameters were affected on this absorption. results show that the optimization sizes of the nano fibers are about 75 nanometers. structures were analyzed by scanning electron microscope (sem) and e...

we report the growth by ion exchange synthesis of zns nanoparticles in mcm-41 matrices using zn (ch3coo)2 and na2s starting sources. the final product (zns/mcm-41) was characterized by x-ray diffraction (xrd) pattern, transmission electron microscopy (tem), scanning electron microscopy (sem), infrared spectrometry (ir) and uv-vis spectroscopy. its crystalline structure and morphology was studie...

Transmission electron backscattered diffraction, t-EBSD, in the scanning electron microscope, SEM, was initially described in 2010 [1]. After slow initial acceptance, the number of publications in which it is used is increasing markedly. Many of the first applications took advantage of the higher resolution of t-EBSD in the study of thin films [2], [3]. More recently it is being used for pre-sc...

A large number of applications of electron-beam lithography (EBL) systems in nanotechnology have been demonstrated in recent years. In this paper we present a simple and general-purpose EBL system constructed by insertion of an electrostatic deflector plate system at the electron-beam exit of the column of a scanning electron microscope (SEM). The system can easily be mounted on most standard S...

Penggunaan bahan limbah sebagai material tambahan pada beton saat ini telah menjadi poin penting dalam industri konstruksi. Hal terjadi karena kebutuhan akan baku konstruksi yang semakin meningkat, sedangkan sumber daya alam terbatas. juga dapat memberikan dampak positif baik terhadap dan lingkungan seperti mampu meningkatkan sifat mekanik mengurangi jumlah dibuang ke lingkungan. Pada penelitia...

When a new approach in microscopy is introduced, broad interest is attracted only when the sample preparation procedure is elaborated and the results compared with the outcome of the existing methods. In the work presented here we tested different preparation procedures for focused ion beam (FIB) milling and scanning electron microscopy (SEM) of biological samples. The digestive gland epitheliu...