The crystal structure and chemical bonding of magnetron-sputtering deposited nickel carbide Ni₁-xCx (0.05 ⩽ x⩽0.62) thin films have been investigated by high-resolution x-ray diffraction, transmission electron microscopy, x-ray photoelectron spectroscopy, Raman spectroscopy, and soft x-ray absorption spectroscopy. By using x-ray as well as electron diffraction, we found carbon-containing hcp-Ni...

Standard X-ray photoelectron spectroscopy (XPS) analysis is thought of by many as a non-destructive form analysis; however, both the interaction photons and subsequent electron cascade can cause significant changes to analysed area. This XPS Insights paper gives brief overview this phenomenon, supported specific examples experimental advice assess minimise damage during analysis.

The thermal properties of vanadium pentoxide (V2O5) thin films have been studied by X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). XPS and UPS data demonstrate that V2O5 thin films are gradually reduced by annealing in the ultrahigh vacuum chamber at temperatures up to 400 8C due to the formation of oxygen vacancy. The oxygen defect in the remaining thi...

The electronic structures of pentacene and C60 interfaces were investigated using ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS). The magnitudes of measured interface dipole were 0.11 eV and 0.07 eV for the C60 deposited on pentacene (C60/pentacene) and the pentacene deposited on C60 (pentacene/C60), respectively. The obtained C 1s spectra on these sampl...