نتایج جستجو برای: ray diffraction measurement then
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Indium (1at %) doped ZnO and ZnO nanoparticles have been synthesized via sol gel method. The structural characters of the synthesized nanoparticles have been studied by X-ray diffraction pattern (XRD), scanning electron microscopy (SEM) and energy-dispersiveX-ray spectroscopy (EDX). From synthesized nanopowders a tablet was prepared by using the isostatic pressing and then sintered at ...
Submicron thick palladium–silver alloy films with 23 wt.% of silver (Pd–Ag23) have been synthesized by simultaneous sputtering from pure targets of Pd and Ag. Full characterization of the deposited films was performed by using X-ray photoelectron spectroscopy, highresolution scanning electron microscopy, high-resolution transmission electron microscopy, and X-ray diffraction. The analytical res...
We have studied an X-ray switch based on a gold coated indium antimonide crystal using time-resolved X-ray diffraction and demonstrated that the switch could reduce the pulse duration of a 100 ps X-ray pulse down to 20 ps with a peak reflectivity of 8%. We have used a dynamical diffraction code to predict the performance of the switch, which was then confirmed experimentally. The experiment was...
X-ray diffraction measurement in the bulk of engineering components allows evaluation of lattice spacing variation by application of Bragg law and hence, by comparison with a strain-free reference specimen, computation of elastic strains and stresses. Diffraction peak position is related to average elastic strain within the scattering grains, whilst diffraction peak shape is related to crystall...
Accurate residual lattice strain measurements are highly dependent upon the precision of diffraction peak location and underlying microstructure suitability. The suitability is related to requirement for valid powder sampling statistics associated number appropriately orientated illuminated. In this work, these two sources uncertainty separated, a method given both quantification errors with in...
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