The ability to probe tip-sample interactions by Atomic Force Microscopy (AFM) has recently boosted our understanding of the matter at atomic scale, enabling study properties surfaces and adsorbates which were previously inaccessible. Nevertheless, this sensitivity forces presents some drawbacks, as requirement a sharp tip apex prevent loss spatial resolution due existence long-range interaction...

in this study, a mixed matrix polyethersulfone/iron-nickel oxide nanoparticle nanofiltration membrane was prepared by the solution casting technique. polyvinylpyrrolidone was also used as a membrane pore former in membrane fabrication. the effect of iron-nickel oxide nanoparticles concentration in the casting solution on the membrane structure and performance was investigated. scanning optical ...

Semiconductor wafer fabrication is perhaps one of the most complex manufacturing processes found today. In this paper, we construct a simulation model of part of a wafer fab using ProModel software and analyze the effect of different input variables on selected parameters, such as cycle time, WIP level and equipment utilization rates. These input variables include arrival distribution, batch si...

Wafer fabrication is a capital-intensive high-tech sector with highly complex manufacturing processes. Therefore, most of the fabs resort to production dispatching as a means to enhancing production efficiency. The commonly seen methods of production dispatching at the present time are devised to meet single performance indicators. Few methods take into account multiple, or even conflicting per...

300 mm semiconductor wafer fabrication facilities, like conventional semiconductor fabs, contain many different types of tools. In this paper we discuss a realistic way of representing cluster tools in a simulation model of the entire line. A more realistic representation of cluster tools results in greater accuracy in the output of the simulation model.