نتایج جستجو برای: metrology
تعداد نتایج: 4764 فیلتر نتایج به سال:
An international workshop on metrology for X-ray and neutron optics, the first of its kind, was held March 16-17, 2000, at the Advanced Photon Source at Argonne National Laboratory. Engineers and scientists from around the world met to evaluate current metrology instrumentation and methods used to characterize the surface figure and finish of long, grazing-incidence optics used in synchrotron r...
This work presents the experience of the National Laboratory for Ionizing Radiation Metrology (LNMRI) in the implementation of the requirements of the Mutual Recognition Arrangement (MRA) signed by 38 National Institutes of Metrology (NMI) in 1999. The degree of equivalence of activity reported by Bureau International des Poids et Mesures (BIPM) in the Key Comparison Data Base (KCDB), the main ...
The decrease in device dimensions is placing extremely tight constraints on many aspects of the CMP process. We outline four key areas that will provide significant steps toward attaining this level of control. In particular, we discuss the need for improved in-line surface topography metrology, and show that that high resolution profilometry appears to meet this need. We demonstrate the need f...
An open-source database containing metrology data for X-ray mirrors is presented. It makes available metrology data (mirror heights and slopes profiles) that can be used with simulation tools for calculating the effects of optical surface errors in the performances of an optical instrument, such as a synchrotron beamline. A typical case is the degradation of the intensity profile at the focal p...
OBJECTIVE Analysing the fundamental methodological aspects which should be considered when drawing up calibration procedure for electro-medical equipment, thereby permitting international standard-based accreditation of electro-medical metrology laboratories in Colombia. METHODS NTC-ISO-IEC 17025:2005 and GTC-51-based procedures for calibrating electro-medical equipment were implemented and t...
Measurement based on international standards for measurement (i.e. metrology) is not the same as the judgment-based quantification of implicit relationships across a mix of entities and attributes without due consideration of admissible mathematical operations on numbers of different scale types. This paper analyzes the Measurement Information Model in ISO 15939 and clarifies what in it refers ...
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. To copy otherwise, to republish, to post on servers or to redistribute to lists, requires prior specific permission....
INFORMATIVENESS AND THE COMPUTATIONAL METROLOGY OF COLLABORATIVE ADAPTIVE SENSOR SYSTEMS
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید