نتایج جستجو برای: geometry effects topography

تعداد نتایج: 1700093  

2007
Johann Cervenka Siegfried Selberherr

Sacrificial etching is one of the most important process steps in micro-electro-mechanical systems technology, since it enables the generation of free-standing structures. These structures are often the main part of micro-mechanical devices, intended to sense or induce a mechanical movement. The etching process transforms an initial multi-segmented geometry and depends on material properties an...

Journal: :Comptes Rendus Geoscience 2023

The potential of high-temperature (>150°C) geothermal systems in crustal fault zones (fault cores and hundreds meters wide networks interconnected fractures the damage zone) is underestimated. Based on numerical models, we show that topography-driven, poroelasticity-driven as well buoyancy-driven forces play a significant role establishment shallow (1–4 km) thermal anomalies zones. We investiga...

شاه محمدپور سلمانی, علیرضا,

After decline and fall of the Parthian dynasty by Ardeshir Babakan in early third century, the new dynasty, called Sasanian, rose. The quantity of the remained of the Sasanian dynasty in compare with the Parthian shows that construction activities such as building bridges, dams, castles and cities are considerably developed. Establishment of many Persian ancient cities is attributed to the firs...

Journal: :Journal of Physics D 2021

Modulating the electric potential on a conducting electrode is presented to generate an optical contrast for scattering microscopy that sensitive both surface charge and local topography. We dub this method Electric-Double-Layer-Modulation microscopy. numerically compute change in ion concentration origin of three experimentally relevant geometries: nanosphere, nanowire, nanohole. In absence pl...

Journal: :Applied Physics Letters 2022

Although the scanning microwave microscope (SMM) is based on atomic force (AFM), SMM differs from AFM by being able to sense subsurface electromagnetic properties of a sample. This makes promising for in-depth nondestructive characterization nanoelectronic structures. However, raw data are convoluted with sample topography, making it especially challenging quantitative nonplanar In this paper, ...

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