The existence of polytypism in semiconductor nanostructures gives rise to the appearance of stacking faults which many times can be treated as quantum wells. In some cases, despite of a careful growth, the polytypism can be hardly avoided. In this work, we perform an ab initio study of zincblende stacking faults in a wurtzite InP system, using the supercell approach and taking the limit of low ...

In this paper, we will present an analysis on the fault erasure BP decoders based on the density evolution. In the fault BP decoder, messages exchanged in a BP process are stochastically corrupted due to unreliable logic gates and flip-flops; i.e., we assume circuit components with transient faults. We derived a set of the density evolution equations for the fault erasure BP processes. Our dens...

For a typical MIMO (Multiple-Input Multiple-Output) nonlinear dynamic system, fault detection and isolation usually aim at process faults with an assumption that actuator faults and sensor faults do not occur at the same time, which is not always the case. This paper uses Extended State Observer for real-time process fault detection and fuzzy inference for fault isolation. It then investigates ...

This paper addresses the design of an observer-based fault diagnosis scheme, which is applied to some of the sensors and actuators of a wind turbine benchmark model. The methodology is based on a modified sliding mode observer (SMO) that allows accurate reconstruction of multiple sensor or actuator faults occurring simultaneously. The faults are reconstructed using the equivalent output err...

−A new faulty sensor monitoring method based on an adaptive neuro-fuzzy inference system (ANFIS) is proposed to improve the monitoring performance of indoor air quality (IAQ) in subway stations. To enhance network performance, a data preprocessing step for detecting outliers and treating missing data is implemented before building the monitoring models. A squared prediction error (SPE) monitori...

Redundant faults in digital circuits not only result in extra hardware but also mask other faults and may also make undetectable fault detectable. Redundancies increase the chip area, the power consumption, and often propagation delays in the circuit and might even reduce the yield [5]. This paper is a result of literary search for detection and removal of such faults. This paper addresses proc...