نتایج جستجو برای: ellipsometry

تعداد نتایج: 2054  

Journal: :Scientific and Technical Journal of Information Technologies, Mechanics and Optics 2017

2016
S. M. Aouadi E. Tobin N. Finnegan S. L. Rohde R. T. Haasch

of CrBN films deposited by ion beam assisted deposition" (2002). This article reports on the growth and analysis of CrBN nanocrystalline materials using an ion beam assisted deposition process. In addition, this article addresses the utilization of spectroscopic ellipsometry for in situ analysis of ternary nitrides. Coatings, with a total thickness of 1.5 Ϯ0.2 ␮m, were deposited at low temperat...

Journal: :Materia-rio De Janeiro 2023

Ba1-xGdxTiO3 thin films have been fabricated at different Gd3+ ionic concentrations, film thicknesses, and annealing temperatures using the sol-gel method. The refractive index of on a silicon substrate is characterized Spectroscopic Ellipsometry (SE), where ellipsometry angles Ψ Δ are fitted very well with Cauchy dispersion model. results show that 632.8 nm decreases from 2.18 to 1.892 increas...

Journal: :The Review of scientific instruments 2010
Chang-Ki Min David G Cahill Steve Granick

We describe a sensitive method for measuring time-dependent changes in refractive index within approximately 5 microm of an interface using off-null time-resolved ellipsometry and a dual-cavity femtosecond laser. The sensitivity to changes in refractive index is two orders of magnitude higher than conventional picosecond interferometry. A thin metal film on a sapphire substrate is heated by app...

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