نتایج جستجو برای: economic statistical design esd
تعداد نتایج: 1574126 فیلتر نتایج به سال:
The control charts are graphical tools and proven techniques to improve the performance of a process. Usually, the processes are not naturally controlled, so the use of control charts will help to reduce the variability and increase the stability of the process. In the traditional approach, control charts with fix sample size and constant sampling intervals were used to identify the changes in ...
In this research, we propose a bi-objective model for the economic-statistical design of the X-bar and S control charts. The model minimizes out-of-control average time to signal as well as minimizing mean hourly loss-cost where it incorporates the Taguchi loss function. Statistical constraint is considered in the model to achieve desired in-control time to signal. A non-dominated sort...
Quality of Service provisioning is one of the major design goals of IEEE 802.16 mesh networks. In order to provide quality delivery of delay sensitive services such as voice, video etc., it is required to route such traffic over a minimum delay path. In this paper we propose a routing metric for delay sensitive services in IEEE 802.16 mesh networks. We design a new cross layer routing metric, n...
the hotelling's control chart, is the most widely used multivariate procedure for monitoring two or more related quality characteristics, but it’s power lacks the desired performance in detecting small to moderate shifts. recently, the variable sampling intervals (vsi) control scheme in which the length of successive sampling intervals is determined upon the preceding values has been pro...
ESD robustness of Low Temperature Poly-Si (LTPS) diodes and TFT devices has been investigated in this paper. By using the Transmission Line Pulsing (TLP) techniques, the It2 (secondary breakdown current) of LTPS diodes and TFT devices were measured. To evaluate the ESD robustness of components for ESD protection, the shifts of breakdown voltage and cut-in voltage of LTPS diode and TFT devices a...
ESD robustness of Low Temperature Poly-Si (LTPS) diodes and TFT devices has been investigated in this paper. By using the Transmission Line Pulsing (TLP) techniques, the It2 (secondary breakdown current) of LTPS diodes and TFT devices were measured. To evaluate the ESD robustness of components for ESD protection, the shifts of breakdown voltage and cut-in voltage of LTPS diode and TFT devices a...
CCC-r control chart is a monitoring technique for high yield processes. It is based on the analysis of the number of inspected items until observing a specific number of defective items. One of the assumptions in implementing CCC-r chart that has a significant effect on the design of the control chart is that the inspection is perfect. However, in reality, due to the multiple reasons, the...
This paper proposes a multi-objective model for the economic-statistical design of the variable sample size and sampling interval multivariate exponentially weighted moving average control chart by using double warning lines. The Markov chain approach is used to obtain the statistical properties. We extend the Lorenzen and Vance cost function considering multiple assignable causes and multivari...
Cumulative Count of Conforming (CCC) charts are utilized for monitoring the quality characteristics in high-quality processes. Executive cost of control charts is a motivation for researchers to design them with the lowest cost. Usually in most researches, only one objective named cost function is minimized subject to statistical constraints, which is not effective method for economic-statistic...
Control chart is the most well-known chart to monitor the number of nonconformities per inspection unit where each sample consists of constant size. Generally, the design of a control chart requires determination of sample size, sampling interval, and control limits width. Optimally selecting these parameters depends on several process parameters, which have been considered from statistical and...
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