نتایج جستجو برای: atomic force microscope afm

تعداد نتایج: 302535  

Journal: :Proceedings of the National Academy of Sciences of the United States of America 1995
T Boland B D Ratner

We have used self-assembled purines and pyrimidines on planar gold surfaces and on gold-coated atomic force microscope (AFM) tips to directly probe intermolecular hydrogen bonds. Electron spectroscopy for chemical analysis (ESCA) and thermal programmed desorption (TPD) measurements of the molecular layers suggested monolayer coverage and a desorption energy of about 25 kcal/mol. Experiments wer...

Journal: :Nanoscale 2012
Yuping Shan Jinfeng Huang Juanjuan Tan Gui Gao Shuheng Liu Hongda Wang Yuxin Chen

To determine the effects of biophysical parameters (e.g. charge, hydrophobicity, helicity) of peptides on the mechanism of anticancer activity, we applied a single molecule technique-force spectroscopy based on atomic force microscope (AFM)-to study the interaction force at the single molecule level. The activity of the peptide and analogs against HeLa cells exhibited a strong correlation with ...

2003
Metin Sitti

Nanomanipulation as a new emerging area enables to change, interact and control the nanoscale phenomenon precisely. In this paper, teleoperated and automatic control strategies for Atomic Force Microscope (AFM) probe based nanomanipulation applications are introduced. Teleoperated touching to silicon surfaces at the nanoscale is realized using a scaled bilateral force-reflecting servo type tele...

2008
Shahid Naeem Yu Liu Heng-Yong Nie W. M. Lau Jun Yang

Recently, the rapid advances in quantitative biology and polymer science have led to the atomic force microscope AFM being extensively employed for single-molecule force spectroscopy. Deflection sensitivity, a critical factor in single molecule force spectroscopy, is changed due to the change in bending shape of AFM cantilever when a single molecule is attached to the AFM cantilever tip. We qua...

2001
F. L. Degertekin G. W. Woodruff B. Hadimioglu

An actuation method for atomic force microscope ~AFM! cantilevers in fluids is reported. The radiation pressure generated by a focused acoustic transducer at radio frequency ~rf! ~100–300 MHz! exerts a localized force of controlled amplitude at a desired location on the AFM cantilever. This force can be used to measure the spring constant and other dynamic properties of the cantilever. Furtherm...

Journal: :Microelectronics Reliability 2002
Huimin Xie Anand K. Asundi Chai Gin Boay Lu Yunguang Jin Yu Zhaowei Zhong Bryan K. A. Ngoi

The formation mechanism of atomic force microscope (AFM) Moir e is explained using the transmittance function. The technique for preparing the AFM Moir e specimen grating is described. The sensitivity and accuracy of this method is analyzed. AFM Moir e method is used to measure the thermal deformation ball grid array (BGA) electronic package. The shear strain at the different solders in the BGA...

Journal: :Nano letters 2013
Krishna P Sigdel Justin S Grayer Gavin M King

The prospect of a robust three-dimensional atomic force microscope (AFM) holds significant promise in nanoscience. Yet, in conventional AFM, the tip-sample interaction force vector is not directly accessible. We scatter a focused laser directly off an AFM tip apex to rapidly and precisely measure the tapping tip trajectory in three-dimensional space. This data also yields three-dimensional cant...

2012
Ahmed M. Ahtaiba Munther A. Gdeisat David R. Burton Francis A. Lilley

All atomic force microscope (AFM) images suffer from distortions, which are principally produced by the interaction between the measured sample and the AFM tip. The atomic force microscope (AFM) is a very important instrument for use in nanotechnology and biology since it can be used to measure a wide variety of objects, such as nano-particles and cells, either in air or liquid. However, the im...

2015
Basheer Ahmed Fei Chen

-Anodizing of AZ 31 Mg alloy was investigate in 3M KOH solution for 10, 20 and 30min. at constant voltage of 5V. Atomic force microscope (AFM) used to investigate the roughness of anodic film formed on the surface while the scanning electron microscope (SEM) was used to determine the morphology of the anodic film, it was found that the roughness of the anodic film is mainly depend on the anodiz...

Journal: :Nanotechnology 2009
Sven Barth Catalin Harnagea Sanjay Mathur Federico Rosei

Tin oxide nanowires (NWs) exhibit interesting electronic properties, which can be harnessed for applications in nanoelectronic devices and sensors. Oriented single crystalline tin oxide NWs were grown at 45 degrees from a titanium dioxide substrate. Their elastic properties were investigated in a two-point geometry using an atomic force microscope (AFM) coupled with a scanning electron microsco...

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